Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Peter S Walecki"'
Autor:
Gabriel Taubin, Peter S. Walecki
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 69:8383-8392
Most 3-D laser scanners are based on 3-D optical triangulation algorithms, where the location of each 3-D point is estimated as the intersection of a camera ray and a plane of light projected by a laser line generator. Since a physical laser-line gen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21b2e290c20f95ba23f01bb42266867d
https://doi.org/10.1109/tim.2020.2987619
https://doi.org/10.1109/tim.2020.2987619
Autor:
Ndubuisi G. Orji, Sebastian W. Schmidt, Hiroshi Itoh, Ronald G. Dixson, Peter S. Walecki, Bernd Irmer, Chumei Wang
Publikováno v:
Ultramicroscopy. 162:25-34
In atomic force microscopy (AFM) metrology, the tip is a key source of uncertainty. Images taken with an AFM show a change in feature width and shape that depends on tip geometry. This geometric dilation is more pronounced when measuring features wit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a3bc3821c3026200caefd010c3e07c10
https://doi.org/10.1016/j.ultramic.2015.12.003
https://doi.org/10.1016/j.ultramic.2015.12.003
Autor:
Peter S. Walecki, Amy S. Edelson, Abigail S. Walecki, Hayley Cho, Wojciech J. Walecki, Eve S. Walecki, James Klep, Alvin Kim, Kensei Yasuda, Timofej Timofejev
Publikováno v:
The Physics Teacher. 54:394-396
In his beautiful paper, Hasan Fakhruddin reported observations of mirror-like reflections in the rough surface of a ground glass plate. Similar effects have been recently employed for metrology of the roughness of optical diffusers used in modern lig
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0844ba8705dc2d5b63ce2f8a29ebecdc
https://doi.org/10.1119/1.4962772
https://doi.org/10.1119/1.4962772
Autor:
Peter S. Walecki, Wojciech J. Walecki
Publikováno v:
SPIE Proceedings.
We have built a novel oblique angle scatterometer designed and optimized for measurements of rough surfaces having a root mean square roughness value (RMS Roughness) on the order of 100 nm – 1000 nm or larger. The majority of existing techniques fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::38ad9ebf5a92ed96452623ea4b96ead7
https://doi.org/10.1117/12.2075540
https://doi.org/10.1117/12.2075540
Autor:
James Klep, Wojciech J. Walecki, Charles Chu, Eve S. Walecki, Jenna Cohen, Shihao Lin, Simona Babb, Peter S. Walecki, Danielle Weisman, Summer Watt, Tianchen Yao, Naiwen Hu, Giana Sangiovanni
Publikováno v:
The Physics Teacher. 53:548-549
We investigate a water-filled bottle rolling down an incline and ask the following question: is a rolling bottle better described by a model ignoring all internal motion where the bottle is approximated by a material point sliding down an incline, or
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::983abd1881614c19226205dd61663bce
https://doi.org/10.1119/1.4935768
https://doi.org/10.1119/1.4935768
Publikováno v:
Journal of Laser Applications. 29:022602
We present a novel, high incidence angle metrology tool for in-situ characterization of diffusers for light emitting device manufacturing. This metrology tool can be easily integrated on the side windows of the process chamber and is insensitive to v
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::751d5742685ca2241200eda9e127cfa5
https://doi.org/10.2351/1.4983521
https://doi.org/10.2351/1.4983521
Autor:
Rebekah L Wildenberg, Charles D Kilvington, Franco E Camacho, Eve S. Walecki, Felix J Herrmann, Peter S. Walecki, Wojciech J. Walecki
Publikováno v:
Physics Education. 51:055008
We measured and analysed the stability of two types of soap films suspended on two rings using the simple conical frusta-based model, where we use common definition of conical frustum as a portion of a cone that lies between two parallel planes cutti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::76911ff3526a2884fc86e06b5487459f
https://doi.org/10.1088/0031-9120/51/5/055008
https://doi.org/10.1088/0031-9120/51/5/055008
Publikováno v:
SPIE Proceedings.
A large numerical aperture (NA in range 0.65-0.8), diffraction limited, broadband (100 nm - 30,000 nm), all-reflective confocal microscope objective design is discussed. The design is compatible with engineered polarization state of the excitation be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a22925d767b69e5f190d41b9eeb8a165
https://doi.org/10.1117/12.883385
https://doi.org/10.1117/12.883385
Autor:
Felix J Herrmann, Charles D Kilvington, Rebekah L Wildenberg, Franco E Camacho, Wojciech J Walecki, Peter S Walecki, Eve S Walecki
Publikováno v:
Physics Education; Sep2016, Vol. 51 Issue 5, p1-1, 1p