Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Peter Palmen"'
Autor:
Bert J. Kip, Peter Palmen, André van der Pol, M. L. Scheepers, Dietrich Wienke, Holger Hartwig, Michel Joseph Germain Huys, Ton Berghmans
Publikováno v:
Vibrational Spectroscopy. 24:75-92
In recent years, considerable developments have taken place in Raman, mid-infrared (mid-IR) and near-infrared (NIR) instrumentation. This has had a major influence on the number and type of applications these techniques have in industry. In the curre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9a88c1ce6be53870eeea87601ac57386
https://doi.org/10.1016/s0924-2031(00)00081-3
https://doi.org/10.1016/s0924-2031(00)00081-3
Autor:
Peter Palmen, Willem G. Haanstra, Wei G. Hansen, Vincent A. L. Wortel, Sophie C. C. Wiedemann, Michel Joseph Germain Huys, Bert J. Kip, Teun Van De Weerdhof, Jan Roumen, Marchel Snieder
Publikováno v:
Applied Spectroscopy. 52:863-868
Transmission (400 to 2500 nm) and reflectance spectra (400 to 2200 nm) were recorded from polyethylene films (low-density PE, cryst. 60%, additive free), with a thickness ranging from 0.2 to 8.46 mm. The information depth, defined as the thickness of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::34342050e278fe92da8c5d98f5a1040e
https://doi.org/10.1366/0003702981944409
https://doi.org/10.1366/0003702981944409