Zobrazeno 1 - 10
of 123
pro vyhledávání: '"Peter Lamparter"'
Autor:
Eric J. Mittemeijer, Peter Lamparter
Publikováno v:
International Journal of Materials Research. 98:485-495
Nanocrystalline vanadium powders have been produced by ball milling in a planetary mill. The morphology of the powder particles has been investigated by scanning electron microscopy. Crystallite size (size of coherently diffracting domains) and latti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ba181f2f45fbe3dc8b42ade7b709f1e4
https://doi.org/10.3139/146.101492
https://doi.org/10.3139/146.101492
Publikováno v:
Zeitschrift für Naturforschung A. 61:189-196
From the combination of quantitative electron-diffraction data with X-ray- and neutron-diffraction data (so-called three-beam experiment) the partial structure factors and pair correlation functions of amorphous sputter deposited W28O72 were determin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b4247ddc1ce412836764ce06e66594eb
https://doi.org/10.1515/zna-2006-3-412
https://doi.org/10.1515/zna-2006-3-412
Publikováno v:
Zeitschrift für Naturforschung A. 60:459-468
A method has been developed to obtain quantitative electron diffraction data up to a value of Q = 20 Å−1 of the modulus of the scattering vector. The experiments were performed on a commercially available transmission electron microscope equipped
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f357d36df63bbc27827ff4a0efb28971
https://doi.org/10.1515/zna-2005-0612
https://doi.org/10.1515/zna-2005-0612
Publikováno v:
Thin Solid Films. 474:50-63
Cu films, 5 and 500 nm thick, were sputtered onto amorphous SiO2 and Si3N4 substrates. The dependence of the film properties on the deposition pressure and the type and cleaning conditions of the substrate was investigated by Atomic Force Microscopy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46a4a3eaad7e05d2902a178875c196be
https://doi.org/10.1016/j.tsf.2004.08.006
https://doi.org/10.1016/j.tsf.2004.08.006
Publikováno v:
Journal of Applied Crystallography. 38:1-29
The components of the macroscopic mechanical stress tensor of a stressed thin film, coating, multilayer or the region near the surface of a bulk material can in principle be determined by X-ray diffraction. The various analysis methods and measuremen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7e78d34cd0821a3ab250ad6a66bf90c1
https://doi.org/10.1107/s0021889804029516
https://doi.org/10.1107/s0021889804029516
Publikováno v:
Journal of Applied Physics. 95:466-476
Nb films with thicknesses 5, 20, 100, and 500 nm were deposited by magnetron sputtering onto Si wafers covered with amorphous layers of SiO2 and Si3N4. The substrates were used in the as-received and sputter cleaned conditions. Various methods were a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4808caecf32736b3f8423baa937439ef
https://doi.org/10.1063/1.1631733
https://doi.org/10.1063/1.1631733
Publikováno v:
Materials Science Forum. :119-122
Palladium powder was deformed by ball milling under an argon atmosphere in two types of mills for different milling times. Two methods for X-ray diffraction line profile analysis, the Williamson-Hall method and the Warren-Averbach method, yielded sim
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2d20a85854027976667662ad485fc118
https://doi.org/10.4028/www.scientific.net/msf.443-444.119
https://doi.org/10.4028/www.scientific.net/msf.443-444.119
Publikováno v:
Chemistry of Materials. 16:83-92
The atomic structure and phase separation of amorphous Si−B−C−N ceramic powder samples obtained by thermolysis of boron-modified polysilazanes were investigated using X-ray and neutron diffraction in the wide-angle and small-angle scattering re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3651fcbe31bf7f2068e078df158e8407
https://doi.org/10.1021/cm031088t
https://doi.org/10.1021/cm031088t
Publikováno v:
Chemistry of Materials. 16:72-82
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::935cade43bbacc8341d91de0bbccba48
https://doi.org/10.1021/cm031029f
https://doi.org/10.1021/cm031029f
Publikováno v:
Materials Science Forum. :691-696
Thin (500 nm thick) and ultra thin (5 nm thick) Cu films were sputter deposited on as-received and sputter cleaned amorphous Si 3 N 4 substrates. Their stresses were determined by the X-ray diffraction sin 2 ψ method. Due to the strong Cu {111} text
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::471dc0ba2e01d5b05bc42022e7984dca
https://doi.org/10.4028/www.scientific.net/msf.404-407.691
https://doi.org/10.4028/www.scientific.net/msf.404-407.691