Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Peter I. Porshnev"'
Autor:
Peter I Porshnev
Publikováno v:
Journal of High Energy Physics, Gravitation and Cosmology. :142-167
Autor:
Peter I Porshnev
Publikováno v:
Physica Scripta. 96:035303
The measurement of electric dipole moment in storage rings can potentially exceed the sensitivity of tests with neutral systems. The spin dynamics under such conditions is described by the Bargmann-Michel-Telegdi equation. It can be derived in the se
Autor:
Jonathan Grava, Yezheng Tao, Bruno La Fontaine, Daniel J. W. Brown, Robert A. Bergstedt, Chirag Rajyaguru, Nigel R. Farrar, Kevin Zhang, Robert N. Jacques, Alex I. Ershov, Norbert R. Bowering, Silvia De Dea, Toshi Ishihara, Georgiy O. Vaschenko, David W. Myers, David R. Evans, Christopher J. Wittak, David C. Brandt, Imtiaz Ahmad, Alexander Schafgans, Richard L. Sandstrom, Vladimir B. Fleurov, Palash P. Das, Igor V. Fomenkov, Robert J. Rafac, Shailendra N. Srivastava, Peter I. Porshnev, Spencer Rich, Peter Baumgart, Rod D. Simmons, Tedsuja Ishikawa, Wayne J. Dunstan, Kay Hoffmann
Publikováno v:
Extreme Ultraviolet (EUV) Lithography IV.
Laser produced plasma (LPP) systems have been developed as the primary approach for use in EUV scanner light sources for optical imaging of circuit features at 20nm nodes and beyond. This paper provides a review of development progress and productiza
Autor:
Michael J. Lercel, Chirag Rajyaguru, Richard L. Sandstrom, Bruno La Fontaine, David W. Myers, Kevin Zhang, Toshi Ishihara, Silvia De Dea, Georgiy O. Vaschenko, Norbert R. Bowering, Robert N. Jacques, Jonathan Grava, Alex I. Ershov, Daniel J. W. Brown, Robert A. Bergstedt, Christian J. Wittak, Imtiaz Ahmad, Michael R. Woolston, Alexander N. Bykanov, Vladimir B. Fleurov, David C. Brandt, Peter I. Porshnev, Alexander Schafgans, Shailendra N. Srivastava, Robert J. Rafac, Rod D. Simmons, Wayne J. Dunstan, Palash P. Das, Igor V. Fomenkov, Peter Baumgart, Yezheng Tao
Publikováno v:
SPIE Proceedings.
Laser produced plasma (LPP) systems have been developed as the primary approach for the EUV scanner light source for optical imaging of circuit features at sub-22nm and beyond nodes on the ITRS roadmap. This paper provides a review of development pro