Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Peter Hanaway"'
Autor:
Peter Hanaway, Carolyn Guidarelli, Peter G. Jacobs, J.R. Condon, Uma Rajhbeharrysingh, Joseph Leitschuh, Clara Mosquera-Lopez, Kerri M. Winters-Stone
Publikováno v:
EMBC
In this paper, we describe a novel portable test platform that can be used to test peripheral neuropathy either within a clinic or at home. The system, called the PeriVib, is comprised of (1) a small, custom vibration motor designed to apply a vibrat
Publikováno v:
Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT). 2011:002199-002225
3D-TSV stacking with non-reworkable bonding processes implies known-good die screening with high test coverage to be economical.Depending upon the stack architecture, the need to contact TSVs directly or TSV bonding pads during wafer test ranges from
Autor:
Reed Gleason, Marc Van Dievel, Peter Hanaway, Bruno Knuts, Erik Jan Marinissen, T. Daenen, Kenneth R. Smith, Eric W. Strid, Mike Jolley, Luc H. Dupas
Publikováno v:
ITC
Practical silicon stacking requires pre-tested dies, but contact probing of TSV interconnects requires much higher density, lower probing forces, and lower cost per pin than conventional probe cards have achieved. This paper examines a cost-effective
Publikováno v:
2008 IEEE MTT-S International Microwave Symposium Digest.
This paper presents an integrated broadband balun probe for differential circuit measurements. The balun consists of the two broadside coupled coplanar strips with a finite ground plane. A new analysis method for the Marchand balun is developed for o