Zobrazeno 1 - 10
of 31
pro vyhledávání: '"Peter Gawlitza"'
Autor:
Silja Flenner, Johannes Hagemann, Malte Storm, Adam Kubec, Peng Qi, Christian David, Elena Longo, Sven Niese, Peter Gawlitza, Berit Zeller-Plumhoff, Jan Reimers, Martin Müller, Imke Greving
Publikováno v:
Flenner, S.; Hagemann, J.; Storm, M.; Kubec, A.; Qi, P.; David, C.; Longo, E.; Niese, S.; Gawlitza, P.; Zeller-Plumhoff, B.; Reimers, J.; Müller, M.; Greving, I.: Hard X-ray nanotomography at the P05 Imaging beamline at PETRA III. In: Proceedings of SPIE: Developments in X-Ray Tomography XIV. Vol. 12242 2022. 122420L. (DOI: /10.1117/12.2632706)
Hard X-ray nanotomography is a commonly used tool in many research areas such as material science, biology and medicine. The nanotomography station at the P05 imaging beamline at PETRA III at DESY is operated by the Helmholtz-Zentrum Hereon and optim
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ed4447268e3ae352ac63470d32769db6
https://doi.org/10.1117/12.2632706
https://doi.org/10.1117/12.2632706
Autor:
Frank, Seiboth, Adam, Kubec, Andreas, Schropp, Sven, Niese, Peter, Gawlitza, Jan, Garrevoet, Vanessa, Galbierz, Silvio, Achilles, Svenja, Patjens, Michael E, Stuckelberger, Christian, David, Christian G, Schroer
Publikováno v:
Optics express. 30(18)
Diffraction-limited hard X-ray optics are key components for high-resolution microscopy, in particular for upcoming synchrotron radiation sources with ultra-low emittance. Diffractive optics like multilayer Laue lenses (MLL) have the potential to rea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::5f28b2f48e96f891c302fe1c80084112
https://pubmed.ncbi.nlm.nih.gov/36242232
https://pubmed.ncbi.nlm.nih.gov/36242232
Publikováno v:
Optics Express
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=r3c4b2081b22::2d6c92b2bb8dddd477bc6125da6f4830
Autor:
Peter Gawlitza, Werner Ecker, Juraj Todt, Martin Rosenthal, Sven Niese, Christian Mitterer, Jozef Keckes, Jakub Zalesak, Hynek Hruby, Michael Meindlhumer, Rostislav Daniel
Publikováno v:
'Materials and Design ', vol: 195, pages: 109023-1-109023-16 (2020)
Publons
Materials & Design, Vol 195, Iss, Pp 109023-(2020)
Publons
Materials & Design, Vol 195, Iss, Pp 109023-(2020)
In order to interpret the mechanical response of thin films subjected to scratch tests, it is necessary to elucidate local stress distributions and microstructural changes accompanying deformation across the scratch track area. Here, 50 nm synchrotro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fff8504f5d6b1dbcfd517a772d9626b5
https://lirias.kuleuven.be/handle/20.500.12942/687855
https://lirias.kuleuven.be/handle/20.500.12942/687855
Autor:
Sebastian Roling, Victor Kärcher, Liubov Samoylova, Karen Appel, Stefan Braun, Peter Gawlitza, Frank Siewert, Ulf Zastrau, Matthias Rollnik, Frank Wahlert, Helmut Zacharias
Publikováno v:
Advances in X-ray Free-Electron Lasers Instrumentation IV.
For the High Energy Density Instrument HED at the European XFEL a hard x ray split and delay unit SDU is built covering photon energies in the range between 5 keV and 24 keV. This SDU enables time resolved x ray pump x ray probe experiments as well a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e28f40f515481cd94d540bc35571953e
https://doi.org/10.1117/12.2265750
https://doi.org/10.1117/12.2265750
Publikováno v:
AIP Conference Proceedings.
Diffractive X-ray optical elements made by thin film coating techniques such as multilayer Laue lenses (MLL) and multilayer zone plates (MZP) are promising approaches to achieve resolutions in hard X-ray microscopy applications of less than 10 nm. Th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::455c9c4436b83ff509f8d283dc989718
https://doi.org/10.1063/1.4952882
https://doi.org/10.1063/1.4952882
Autor:
Andreas Leson, Sven Niese, Manfred Burghammer, Adam Kubec, Peter Gawlitza, Jürgen Gluch, Jozef Keckes, Martin Rosenthal
Publikováno v:
Journal of Instrumentation. 13:C04011-C04011
We report on recent results of focusing experiments with monolithic assembled multilayer Laue lenses (MLLs) at ESRF ID13 with a focal length of 9.5 mm at an X-ray photon energy of 12.7 keV. Using an aperture of approximately 40 \textmu m we have achi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::653abe0fb38a6140235bbb5f42c7da2b
https://doi.org/10.1088/1748-0221/13/04/c04011
https://doi.org/10.1088/1748-0221/13/04/c04011
Publikováno v:
Vakuum in Forschung und Praxis. 19:37-43
Die Ionenstrahlsputterbeschichtung zeichnet sich gegenuber alternativen Vakuum-Beschichtungstechniken wie Verdampfung oder Magnetronsputtern durch hohere kinetische Energien der schichtbildenden Teilchen aus. Damit lassen sich dichte, glatte und defe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ad753fe668f5cab953ab878286277e89
https://doi.org/10.1002/vipr.200700310
https://doi.org/10.1002/vipr.200700310
Autor:
M. Menzel, J. Mai, R. Stober, A. Eibsich, M. Sarstedt, A. Luca, J. Landrock, S. Braun, A. Leson, Robert Mueller, Peter Gawlitza
Publikováno v:
Society of Vacuum Coaters 58th (2015) Annual Technical Conference Proceedings.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::852e3dec9cbd65c375a0ca385941b0c2
https://doi.org/10.14332/svc15.proc.1901
https://doi.org/10.14332/svc15.proc.1901