Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Peter Deixler"'
Publikováno v:
IEEE Transactions on Electron Devices. 53:1601-1607
Solid-state varactor performance is evaluated in light of fundamental tradeoffs imposed by semiconductor material. This leads to the important conclusion that the product of Q factor, frequency, tuning range, and breakdown voltage has an upper limit
Autor:
Roy A. Colclaser, Peter Deixler
Publikováno v:
Silicon Heterostructure Handbook: Materials, Fabrication, Devices, Circuits and Applications of SiGe and Si Strained-Layer Epitaxy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fe5cd5be9e1caac576a8db47ec09a8c3
https://doi.org/10.1201/9781420026580.ch3.12
https://doi.org/10.1201/9781420026580.ch3.12
Autor:
W.D. van Noort, Angel Rodríguez, R.J. Havens, P.H.C. Magnee, N. Bell, Eyup Aksen, Ronald Dekker, W.B. de Boer, D. Bower, Peter Deixler
Publikováno v:
Scopus-Elsevier
An industrial SiGe BiCMOS technology is presented, in which the silicon substrate has been removed and replaced by a lossless glass substrate. This will enable the integration of better passives, while the active devices remain fully library compatib
Publikováno v:
2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535).
This paper reports on the power performance of RF high-breakdown voltage (>16.5 V) SiGeC HBT power devices, which have been successfully integrated into a BiCMOS platform featuring 0.25 /spl mu/m CMOS and a full set of high-quality passives. These de