3D Imaging and Quantitative Subsurface Dielectric Constant Measurement Using Peak Force Kelvin Probe Force Microscopy

Autor: Khaled Kaja, Ammar Assoum, Peter De Wolf, François Piquemal, Antonio Nehmee, Adnan Naja, Taha Beyrouthy, Mustapha Jouiad

Publikováno v: Advanced Materials Interfaces, Vol 11, Iss 2, Pp n/a-n/a (2024)

Abstract Noninvasive and depth‐sensitive measurements of dielectric properties are becoming of great interest in advanced and complex nanostructured architectures. Here, a straightforward parallel approach applicable in peak force Kelvin probe forc

Externí odkaz: https://doaj.org/article/e6a583beb9e14f76a183087b54744b54

Automated multi-sample acquisition and analysis using atomic force microscopy for biomedical applications.

Autor: Antoine Dujardin, Peter De Wolf, Frank Lafont, Vincent Dupres

Publikováno v: PLoS ONE, Vol 14, Iss 3, p e0213853 (2019)

In the last 20 years, atomic force microscopy (AFM) has emerged as a ubiquitous technique in biological research, allowing the analysis of biological samples under near-physiological conditions from single molecules to living cells. Despite its growi

Externí odkaz: https://doaj.org/article/41ec3bf677024977a93f4826904f7253

Parametric nano-electrical analysis for SiC junctions of a packaged device

Autor: Rosine Coq Germanicus, Wadia Jouha, Niemat Moultif, Peter De Wolf, Vishal A. Shah, Peter. M Gammon, Ulrike Luders, Olivier Latry

Publikováno v: IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe, WiPDA Europe 2022
IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe, WiPDA Europe 2022, 2022, pp.1-6. ⟨10.1109/WiPDAEurope55971.2022.9936397⟩
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe)
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe), Sep 2022, Coventry, France. pp.1-6, ⟨10.1109/WiPDAEurope55971.2022.9936397⟩

Precise and accurate electrical characterization of power electronics device die structures at the wafer level is essential to compare device operation to the design and to model reliability issues. In this paper, a parametric analysis for local elec

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::87937847d1cab9a8b2fbd9151db53342
https://doi.org/10.1109/wipdaeurope55971.2022.9936397

PeakForce Scanning Electrochemical Microscopy with Nanoelectrode Probes

Autor: Bruce S. Brunschwig, Michael R. Nellist, Zhuangqun Huang, Georg Papastavrou, Chengxiang Xiang, Yikai Chen, Peter De Wolf, Shannon W. Boettcher, Chunzeng Li, Rakesh Poddar, Andreas Mark, Jingjing Jiang

Publikováno v: Microscopy Today. 24:18-25

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5fc1dbf0738e5d505f19157f8835164c
https://doi.org/10.1017/s1551929516000882

Characterizing Interlayer Sub-μm Features in Microelectronics Devices Using High-Resolution Scanning Probe-IR Spectroscopy and Imaging

Autor: Honghua Yang, Peter De wolf, Anirban Roy, Qichi Hu, Sean W. King

Publikováno v: International Symposium for Testing and Failure Analysis.

High resolution scanning probe microscopy techniques combined with infrared (IR) light sources offer unique solutions to combined chemical/mechanical/electrical characterization of defects in nanoscale dimensions. Previously, atomic force microscopy

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6f04710252f0f7e3cd61405cc0aa19e9
https://doi.org/10.31399/asm.cp.istfa2018p0559