Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Peter D. Lloyd"'
Autor:
Merlin Theodore, Emma Betters, Lonnie J. Love, Steven J. Monaco, Peter D. Lloyd, Richard J. Lee, Alan M. Levine, Jesse Heineman, Luke L. Daemen, Vlastimil Kunc, Kim Sitzlar, Gregory S. Larsen, Kunlun Hong, Mariappan Parans Paranthaman, Justin West, Harry M. Meyer, Dale K. Hensley, Yongqiang Cheng, Tej N. Lamichhane
Publikováno v:
ACS Applied Polymer Materials
The current severe acute respiratory syndrome coronavirus 2 (SARS-COV-2) pandemic has highlighted the need for personal protective equipment, specifically filtering facepiece respirators like N95 masks While it is common knowledge that polypropylene
Autor:
Bradley S. Richardson, Peter D. Lloyd, Mark W. Noakes, Brian K. Post, Randall F. Lind, Lonnie J. Love
Publikováno v:
Additive Manufacturing. 24:467-478
Additive manufacturing (AM), commonly referred to as 3D printing, was originally used for rapid prototyping. However, research into new technologies has allowed AM to become applicable far beyond prototype fabrication. Oak Ridge National Laboratory (
Autor:
Cindy Kutchko, Peter D. Lloyd, Kurt G. Olson, William G. Carter, Reza M. Rock, Orlando Rios, Brett G. Compton, David R. Fenn, Brian K. Post
Publikováno v:
Materials Today Communications. 15:333-336
Additive Manufacturing (AM) has the potential to offer many benefits over traditional manufacturing methods in the fabrication of complex parts with advantages such as low weight, complex geometry, and embedded functionality. In practice, today’s A
Autor:
Peter D. Lloyd, Brett G. Compton, Brian K. Post, Chad E. Duty, Donald L. Erdman, Vlastimil Kunc, Lonnie J. Love, Rachel J. Smith, Randall F. Lind
Publikováno v:
Rapid Prototyping Journal. 23:181-189
Purpose This paper aims to investigate the deposited structure and mechanical performance of printed materials obtained during initial development of the Big Area Additive Manufacturing (BAAM) system at Oak Ridge National Laboratory. Issues unique to
Autor:
Ralph B. Dinwiddie, G. S. Marlow, Ryan R. Dehoff, Michael M. Kirka, Peter D. Lloyd, Larry E Lowe
Publikováno v:
SPIE Proceedings.
High performance mid-wave infrared (IR) cameras are used for in-situ electron beam melt process monitoring and temperature measurements. Since standard factory calibrations are insufficient due to very low transmissions of the leaded glass window req