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pro vyhledávání: '"Peter Binev"'
Autor:
Peter Binev
Publikováno v:
SIAM Journal on Numerical Analysis. 56:3346-3357
The hp-adaptive approximation is formulated as an approximation problem on a full binary tree $T$, where for each of the leaves $\Delta$ an order $p(\Delta)\ge1$ is assigned in such a way that the ...
Autor:
Peter Binev, Albert Cohen, Guergana Petrova, Wolfgang Dahmen, Ronald A. DeVore, Przemysław Wojtaszczyk
Publikováno v:
SIAM/ASA Journal on Uncertainty Quantification
SIAM/ASA Journal on Uncertainty Quantification, ASA, American Statistical Association, 2016
SIAM/ASA Journal on Uncertainty Quantification, 2017, 5, pp.1-29
SIAM/ASA Journal on Uncertainty Quantification, ASA, American Statistical Association, 2016
SIAM/ASA Journal on Uncertainty Quantification, 2017, 5, pp.1-29
We consider the problem of optimal recovery of an element $u$ of a Hilbert space $\mathcal{H}$ from $m$ measurements obtained through known linear functionals on $\mathcal{H}$. Problems of this type are well studied \cite{MRW} under an assumption tha
We devise a generalization of tree approximation that generates conforming meshes, i.e., meshes with a particular structure like edge-to-edge triangulations. A key feature of this generalization is that the choices of the cells to be subdivided are a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::548506e43eaf05634f82120a1822fce7
http://arxiv.org/abs/1912.13437
http://arxiv.org/abs/1912.13437
Publikováno v:
SIAM/ASA Journal on Uncertainty Quantification
SIAM/ASA Journal on Uncertainty Quantification, ASA, American Statistical Association, 2018, ⟨10.1137/17M1157635⟩
SIAM/ASA Journal on Uncertainty Quantification, ASA, American Statistical Association, 2018, ⟨10.1137/17M1157635⟩
International audience; We consider the problem of optimal recovery of an unknown function u in a Hilbert space V from measurements of the form j (u), j = 1,. .. , m, where the j are known linear functionals on V. We are motivated by the setting wher
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::be1b943a8183845b67be1fb93af79182
https://hal.archives-ouvertes.fr/hal-01638177v2/document
https://hal.archives-ouvertes.fr/hal-01638177v2/document
Parametric PDEs of the general form $$ \mathcal{P}(u,a)=0 $$ are commonly used to describe many physical processes, where $\mathcal{P}$ is a differential operator, a is a high-dimensional vector of parameters and u is the unknown solution belonging t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0c421e3d530070e86e7bec2a80796d56
https://doi.org/10.14293/p2199-8442.1.sop-math.yfvaqs.v1
https://doi.org/10.14293/p2199-8442.1.sop-math.yfvaqs.v1
Autor:
Michael S. Fox-Rabinovitz, Ronald A. DeVore, A. Belochitski, Peter Binev, Philipp Lamby, Vladimir M. Krasnopolsky
Publikováno v:
Journal of Computational and Applied Mathematics. 236(4):447-460
The computation of Global Climate Models (GCMs) presents significant numerical challenges. This paper presents new algorithms based on sparse occupancy trees for learning and emulating the long wave radiation parameterization in the NCAR CAM climate
Publikováno v:
Constructive Approximation. 26:127-152
This paper is concerned with estimating the regression function fρ in supervised learning by utilizing piecewise polynomial approximations on adaptively generated partitions. The main point of interest is algorithms that with high probability are op
Publikováno v:
Advanced Structural and Chemical Imaging. 1
Electron tomography is widely used for nanoscale determination of 3-D structures in many areas of science. Determining the 3-D structure of a sample from electron tomography involves three major steps: acquisition of sequence of 2-D projection images
Publikováno v:
Advanced Structural and Chemical Imaging 1(1), 2 (2015). doi:10.1186/s40679-015-0003-9
Determining the precise atomic structure of materials’ surfaces, defects, and interfaces is important to help provide the connection between structure and important materials’ properties. Modern scanning transmission electron microscopy (STEM) te
Autor:
Niklas Mevenkamp, Paul M. Voyles, Andrew B. Yankovich, Peter Binev, Wolfgang Dahmen, Benjamin Berkels
Publikováno v:
Advanced Structural and Chemical Imaging 1(1), 3 (2015). doi:10.1186/s40679-015-0004-8
Advanced Structural and Chemical Imaging 1(1), 3 (2015). doi:10.1186/s40679-015-0004-8
Published by Springer International Publishing AG, Cham
Published by Springer International Publishing AG, Cham
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5a8a0ada4c252d7433a5b6617045c217