Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Petar Sevo"'
Autor:
Ruben F. Kranenburg, Fang Ou, Petar Sevo, Maurangelo Petruzzella, Renee de Ridder, Anne van Klinken, Kaylee D. Hakkel, Don M.J. van Elst, René van Veldhoven, Francesco Pagliano, Arian C. van Asten, Andrea Fiore
Publikováno v:
Talanta, 245:123441. Elsevier
Illicit-drug production, trafficking and seizures are on an all-time high. This consequently raises pressure on investigative authorities to provide rapid forensic results to assist law enforcement and legal processes in drug-related cases. Ideally,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0dff28b67bc138241d41f8130493a061
https://hdl.handle.net/11245.1/fa4aef5c-5fb6-4942-92b1-c1829ebe3884
https://hdl.handle.net/11245.1/fa4aef5c-5fb6-4942-92b1-c1829ebe3884
Autor:
Anne van Klinken, Fang Ou, Chenhui Li, Don M. J. van Elst, Maurangelo Petruzzella, Kaylee D. Hakkel, Francesco M. Pagliano, Petar Sevo, René P. J. van Veldhoven, Andrea Fiore
Publikováno v:
Optical Sensing and Detection VII
We demonstrate a novel, fully-integrated approach to spectral sensing in the near-infrared range suitable for analyzing the chemical composition of organic materials. The sensor consists of 16 detector pixels, each forming a resonant-cavity enhanced
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6503eabc456fce2f2df49bfa5c00e12d
https://doi.org/10.1117/12.2620290
https://doi.org/10.1117/12.2620290
Autor:
Fang Ou, Petar Sevo, Maurangelo Petruzzella, Anne van Klinken, Kaylee D. Hakkel, Don M.J. van Elst, Chenhui Li, Francesco Pagliano, Rene P.J. van Veldhoven, Andrea Fiore
Publikováno v:
Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2022
Applied Industrial Optics
Applied Industrial Optics
We present a novel approach to NIR spectral sensing using a handheld module based on a miniaturized integrated detector array. Applicability of the sensor is demonstrated in monitoring moisture in grains and classification of plastics.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ff25a07ba844dc3efa271944f1dda567
https://doi.org/10.1364/AIO.2022.T1A.3
https://doi.org/10.1364/AIO.2022.T1A.3
Autor:
Don M.J. van Elst, Anne van Klinken, Fang Ou, Chenhui Li, Maurangelo Petruzzella, Kaylee D. Hakkel, Francesco Pagliano, Petar Sevo, Rene P.J. van Veldhoven, Andrea Fiore
Publikováno v:
Optica Advanced Photonics Congress 2022.
We demonstrate a compact and robust near-infrared (900-1700nm) spectral sensor consisting of 16 resonant-cavity-enhanced photodetectors. We achieve a tunable spectral response with narrow linewidth and high responsivity and demonstrate the sensing pe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0eeff296902f74c34852e873b0ff7ab5
https://doi.org/10.1364/iprsn.2022.itu3c.1
https://doi.org/10.1364/iprsn.2022.itu3c.1
Autor:
Fang Ou, Anne van Klinken, Petar Ševo, Maurangelo Petruzzella, Chenhui Li, Don M. J. van Elst, Kaylee D. Hakkel, Francesco Pagliano, Rene P. J. van Veldhoven, Andrea Fiore
Publikováno v:
Sensors, Vol 22, Iss 18, p 7027 (2022)
For decades, near-infrared (NIR) spectroscopy has been a valuable tool for material analysis in a variety of applications, ranging from industrial process monitoring to quality assessment. Traditional spectrometers are typically bulky, fragile and ex
Externí odkaz:
https://doaj.org/article/a0f5c32f71dc4144ace55790978f5df4