Zobrazeno 1 - 10
of 40
pro vyhledávání: '"Peschiaroli, D"'
Autor:
Ghidini, G., Garavaglia, A., Giusto, G., Ghetti, A., Bottini, R., Peschiaroli, D., Scaravaggi, M., Cazzaniga, F., Ielmini, D.
Publikováno v:
In Microelectronics Reliability 2003 43(8):1221-1227
Autor:
Peschiaroli, D. *, Clementi, C., Garofalo, P., Ghezzi, P., Ghilardi, T., Lista, V., Marangon, T., Mastracchio, G., Maurelli, A., Niel, S., Palumbo, E., Pipia, F., Soleri, S., Zabberoni, P.
Publikováno v:
In Microelectronic Engineering 2001 55(1):137-143
Autor:
Peschiaroli, D, Brambilla, M, Carnevale, GP, Cascella, A, Cazzaniga, F, Clementi, C, Cremonesi, C, Gilardini, A, Martinelli, M, Maurelli, A, Mica, I, Pavan, A, Pavia, G, Polignano, FP, Soncini, V, BONERA, EMILIANO
In this paper the critical factors for defect formation in device processing are identified and various approaches to the problem of defect suppression in device processing are discussed. The mechanisms of stress development are identified by compari
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1299::339d542fade4c08582f92572e1743046
http://hdl.handle.net/10281/23563
http://hdl.handle.net/10281/23563
Autor:
Calvani, Paolo, Capizzi, Mario, Fabrizi, A., Grilli, Marco, Lupi, Stefano, Maselli, Paola, Peschiaroli, D., Pompa, A., KATAYAMA YOSHIDA, H.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3686::0e546bdad1a259512b3fc9572c67648e
http://hdl.handle.net/11573/246210
http://hdl.handle.net/11573/246210
Autor:
Calvani, Paolo, Capizzi, Mario, Lupi, Stefano, Maselli, Paola, Peschiaroli, D., Pompa, A., KATAYAMA YOSHIDA, H.
The reflectance of Bi 2 Sr 2 Ca n Cu n +1 O 2 n +6 superconducting films with n = 1 and n = 2 has been measured at 300 and 25 K from 400 to 20000 cm −1 . The superconductor conductivity ∼σ(ω) has been singled out from the total reflectance by s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f2f4ff89ed74195b000f598cca5434b6
http://hdl.handle.net/11573/15495
http://hdl.handle.net/11573/15495
Publikováno v:
30th European Solid-State Device Research Conference; 2000, p276-279, 4p
Publikováno v:
Dark Side of the Universe, The: Experimental Efforts & Theoretical Framework - Proceedings of International Workshop; 1994, p290-299, 10p
Autor:
Piazza, F., Colombo, P., Ghezzi, P., Lista, V., Maurelli, A., Palumbo, E., Peschiaroli, D., Soleri, S., Di Base, A., Silvagni, A., Torti, C., Olivo, M., Baldi, L.
Publikováno v:
29th European Solid-State Device Research Conference; 1999, Issue 1, p616-619, 4p