Zobrazeno 1 - 10
of 156
pro vyhledávání: '"Pershenkov, V.S."'
Autor:
Pershenkov, V.S., Petrov, A.S., Bakerenkov, A.S., Ulimov, V.N., Felytsyn, V.A., Rodin, A.S., Belyakov, V.V., Telets, V.A., Shurenkov, V.V.
Publikováno v:
In Microelectronics Reliability September 2017 76-77:703-707
Autor:
Pershenkov, V.S., Bakerenkov, A.S., Felitsyn, V.A., Rodin, A.S., Telets, V.A., Belyakov, V.V.
Publikováno v:
In Microelectronics Reliability August 2016 63:56-59
Autor:
Bakerenkov, A.S., Belyakov, V.V., Kozyukov, A.E., Pershenkov, V.S., Solomatin, A.V., Shurenkov, V.V.
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, A 11 February 2015 773:33-38
Autor:
Pershenkov, V.S., Ullán, M., Wilder, M., Spieler, H., Spencer, E., Rescia, S., Newcomer, F.M., Martinez-McKinney, F., Kononenko, W., Grillo, A.A., Díez, S.
Publikováno v:
In Microelectronics Reliability November 2014 54(11):2360-2363
Autor:
Pershenkov, V.S., Avdeev, S.V., Tsimbalov, A.S., Levin, M.N., Belyakov, V.V., Ivashin, D.V., Slesarev, A.Y., Bashin, A.Y., Zebrev, G.I., Ulimov, V.N., Emelianov, V.V.
Publikováno v:
In Microelectronics Reliability 2002 42(4):797-804
Publikováno v:
In Microelectronics Reliability 2001 41(2):185-191
Autor:
Belyakov, V.V, Chumakov, A.I, Nikiforov, A.Y, Pershenkov, V.S *, Skorobogatov, P.K, Sogoyan, A.V
Publikováno v:
In Microelectronics Reliability 2000 40(12):1997-2018
Publikováno v:
In Microelectronics Reliability 1999 39(4):497-505
Publikováno v:
In Microelectronics Reliability 2006 46(2):641-644
Publikováno v:
2013 14th European Conference on Radiation & Its Effects on Components & Systems (RADECS); 2013, p1-4, 4p