Zobrazeno 1 - 10
of 412
pro vyhledávání: '"Perniola L"'
Publikováno v:
In Microelectronic Engineering 5 August 2018 195:101-106
Publikováno v:
In Microelectronics Reliability September 2017 76-77:178-183
Publikováno v:
In Microelectronic Engineering 25 June 2017 178:61-65
Autor:
Azzaz, M., Benoist, A., Vianello, E., Garbin, D., Jalaguier, E., Cagli, C., Charpin, C., Bernasconi, S., Jeannot, S., Dewolf, T., Audoit, G., Guedj, C., Denorme, S., Candelier, P., Fenouillet-Beranger, C., Perniola, L.
Publikováno v:
In Solid State Electronics November 2016 125:182-188
Autor:
Navarro, G., Sousa, V., Persico, A., Pashkov, N., Toffoli, A., Bastien, J.-C., Perniola, L., Maitrejean, S., Roule, A., Zuliani, P., Annunziata, R., De Salvo, B.
Publikováno v:
In Solid State Electronics November 2013 89:93-100
Autor:
Suri, M., Bichler, O., Hubert, Q., Perniola, L., Sousa, V., Jahan, C., Vuillaume, D., Gamrat, C., DeSalvo, B.
Publikováno v:
In Solid State Electronics January 2013 79:227-232
Autor:
Betti Beneventi, G., Perniola, L., Sousa, V., Gourvest, E., Maitrejean, S., Bastien, J.C., Bastard, A., Hyot, B., Fargeix, A., Jahan, C., Nodin, J.F., Persico, A., Fantini, A., Blachier, D., Toffoli, A., Loubriat, S., Roule, A., Lhostis, S., Feldis, H., Reimbold, G., Billon, T., De Salvo, B., Larcher, L., Pavan, P., Bensahel, D., Mazoyer, P., Annunziata, R., Zuliani, P., Boulanger, F.
Publikováno v:
In Solid State Electronics November-December 2011 65-66:197-204
Autor:
Tirano, S., Perniola, L., Buckley, J., Cluzel, J., Jousseaume, V., Muller, Ch., Deleruyelle, D., De Salvo, B., Reimbold, G.
Publikováno v:
In Microelectronic Engineering 2011 88(7):1129-1132
Autor:
Cueto, O., Jahan, C., Sousa, V., Nodin, J.F., Syoud, S., Perniola, L., Fantini, A., Maitrejean, S., Toffoli, A., de Salvo, B., Boulanger, F.
Publikováno v:
In Microelectronic Engineering 2011 88(5):827-832
Autor:
Jousseaume, V., Fantini, A., Nodin, J.F., Guedj, C., Persico, A., Buckley, J., Tirano, S., Lorenzi, P., Vignon, R., Feldis, H., Minoret, S., Grampeix, H., Roule, A., Favier, S., Martinez, E., Calka, P., Rochat, N., Auvert, G., Barnes, J.P., Gonon, P., Vallée, C., Perniola, L., De Salvo, B.
Publikováno v:
In Solid State Electronics 2011 58(1):62-67