Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Peihan Tu"'
Publikováno v:
ACM Transactions on Graphics. 41:1-23
Repetitive vector patterns are common in a variety of applications but can be challenging and tedious to create. Existing automatic synthesis methods target relatively simple, unstructured patterns such as discrete elements and continuous Bézier cur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ce14462121da0d37572b69671589b97
https://doi.org/10.1145/3528223.3530062
https://doi.org/10.1145/3528223.3530062
Publikováno v:
Computer Graphics Forum. 38:109-122
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c2ea1bdc6393ccd11b3ecb20874ac90b
https://doi.org/10.1111/cgf.13793
https://doi.org/10.1111/cgf.13793
Repetitive patterns are ubiquitous in natural and human-made objects, and can be created with a variety of tools and methods. Manual authoring provides unmatched degree of freedom and control, but can require significant artistic expertise and manual
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::652e9f8c93a45b7853766d835d358e45
Autor:
PEIHAN TU1, YULEI BAI1, WEICHAO XU1, BO DONG1, SHUANGLI YE2, QIYU YANG1, YANZHOU ZHOU1 zhouyanzhou@gdut.edu.cn
Publikováno v:
Optica Applicata. 2017, Vol. 47 Issue 2, p209-223. 15p.
Publikováno v:
Experimental Mechanics. 57:783-799
Digital image correlation (DIC) is a widely used optical metrology for surface deformation measurement. In DIC, the square root of the mean square error (RMS error) and standard deviation error (SD error) are used as quantitative criteria in order to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3270d8a7355682f6957727a265b80fd5
https://doi.org/10.1007/s11340-017-0268-0
https://doi.org/10.1007/s11340-017-0268-0
Publikováno v:
Measurement Science and Technology. 30:045003
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cb9bd6f6e79ed2551621bffee4538c0b
https://doi.org/10.1088/1361-6501/aaf2e4
https://doi.org/10.1088/1361-6501/aaf2e4
Autor:
Peihan Tu
Publikováno v:
Measurement Science and Technology. 28:075008
In digital image correlation (DIC), the systematic error caused by intensity interpolation at sub-pixel positions, namely the overall interpolation bias, includes both interpolation bias and noise-induced bias. The overall interpolation bias is espec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ebce5209314be2ff2b518c336f75e689
https://doi.org/10.1088/1361-6501/aa70f8
https://doi.org/10.1088/1361-6501/aa70f8
Publikováno v:
Measurement Science & Technology; Apr2019, Vol. 30 Issue 4, p1-1, 1p