Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Pei-Chen Yeh"'
Autor:
Pei-Chen Yeh, 葉姵辰
103
The heap-spraying attacks through the composition of malicious JavaScript and depend on the exploited vulnerabilities of browser or plug-in of installed to trigger. The attackers commonly use obfuscated techniques to make obfuscated maliciou
The heap-spraying attacks through the composition of malicious JavaScript and depend on the exploited vulnerabilities of browser or plug-in of installed to trigger. The attackers commonly use obfuscated techniques to make obfuscated maliciou
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/52589947935165795260
Autor:
Pei-chen Yeh, 葉珮甄
99
To this day, development within Chinese culture has seen Chinese characters continuously play an important function. First, the people have internalized the Eastern concept of abstract thinking, and through writing, demonstrate the images of
To this day, development within Chinese culture has seen Chinese characters continuously play an important function. First, the people have internalized the Eastern concept of abstract thinking, and through writing, demonstrate the images of
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/72899399482003440552
Autor:
Pei-Chen Yeh, 葉北辰
94
Verbal aggression occurs frequently in peer interaction among elementary school students. The purpose of the present research is to investigate, during late childhood, the age, sex, and individual differences of the vulnerability and inflamma
Verbal aggression occurs frequently in peer interaction among elementary school students. The purpose of the present research is to investigate, during late childhood, the age, sex, and individual differences of the vulnerability and inflamma
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/65792747378174066068
Autor:
Pei-Chen Yeh, 葉佩真
93
Part I: Analysis of anthraquinones and bianthrones in rhubarb by microemulsion electrokinetic chromatography Microemulsion eletrokinetic chromatograpy (MEEKC) is a separation technique which is similar in principle to micellar electrokinetic
Part I: Analysis of anthraquinones and bianthrones in rhubarb by microemulsion electrokinetic chromatography Microemulsion eletrokinetic chromatograpy (MEEKC) is a separation technique which is similar in principle to micellar electrokinetic
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/49105309866033143461
Autor:
Pei-Chen Yeh, 葉珮甄
87
In semiconductor manufacturing, the most critical indication of process performance is yield. One of the important tools to improve yield is SPC (Statistical Process Control). Effective SPC charting can detect process excursions and provide e
In semiconductor manufacturing, the most critical indication of process performance is yield. One of the important tools to improve yield is SPC (Statistical Process Control). Effective SPC charting can detect process excursions and provide e
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/52365394713791251221
Publikováno v:
Palliative and Supportive Care. 13:1449-1458
Objective:It is common for patients to experience positive and negative psychological changes (e.g., posttraumatic growth or demoralization) after being diagnosed with cancer. Although demoralization and posttraumatic growth are both related to meani
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3c6bcf465564d28c9d5999d300643915
https://doi.org/10.1017/s1478951515000048
https://doi.org/10.1017/s1478951515000048
Autor:
Shao-Wen Sun, Pei-Chen Yeh
Publikováno v:
Journal of Pharmaceutical and Biomedical Analysis. 36:995-1001
In this work a method of microemulsion electrokinetic chromatography (MEEKC) has been developed for the analysis of nine anthraquinones and bianthrones in rhubarb. This study employed di-n-butyl tartrate as oil substance to make up the microemulsion.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0cf6ba7fdb0fda69b55675ad003ed103
https://doi.org/10.1016/j.jpba.2004.08.039
https://doi.org/10.1016/j.jpba.2004.08.039
Publikováno v:
2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406).
In semiconductor manufacturing, post-process metrology and statistical monitoring of quality data are critical to ensure a high yield and good quality products. Effective SPC charting can detect process excursions and provide early warning on possibl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8286787f3c0cdf00e5dd47f0161a3b38
https://doi.org/10.1109/smtw.2000.883106
https://doi.org/10.1109/smtw.2000.883106
Autor:
YU-CHAN LI, PEI-CHEN YEH, HONG-WEN CHEN, YI-FANG CHANG, SHIH-HSUAN PI, CHUN-KAI FANG, Li, Yu-Chan, Yeh, Pei-Chen, Chen, Hong-Wen, Chang, Yi-Fang, Pi, Shih-Hsuan, Fang, Chun-Kai
Publikováno v:
Palliative & Supportive Care; Oct2015, Vol. 13 Issue 5, p1449-1458, 10p, 4 Charts, 2 Graphs
Publikováno v:
2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406); 2000, p279-282, 4p