Variable junction temperature analysis in Silicon IMPATT diode.

Autor: Arshad, T. S. M., Othman, M. A., Yasin, N. Y. M., Taib, S. N., Napiah, Z. A. F. M., Hussain, M. N., Rahim, Y. Abd., Pee, A. N. Che, Ismail, M. M., Misran, M. H., Said, M. A. Meor, Sulaiman, H. A., Ramlee, R. A.

Publikováno v: 2013 3rd International Conference on Instrumentation, Communications, Information Technology & Biomedical Engineering (ICICI-BME); 2013, p76-79, 4p