Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Pedro M. Tome"'
Autor:
Pedro M. Tome, Telmo R. Cunha, Filipe M. Barradas, Joao L. Gomes, Jose C. Pedro, Luis C. Nunes
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 69:529-540
Charge-trapping phenomena in radio-frequency (RF) power amplifiers (PAs) based on GaN high-electron-mobility transistor (HEMT) technology are understood to be responsible for the dynamic self-biasing behavior that leads to a seemingly intractable slo
Publikováno v:
IEEE Transactions on Vehicular Technology. 69:13112-13123
High-resolution delay-Doppler estimation is an important requirement for automotive radar systems, especially in multi-target scenarios that require better target separation performance. Orthogonal frequency-division multiplexing (OFDM) is a promisin
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 68:3709-3723
In this article, we present an analog circuit for the compensation of long-term memory effects in power amplifiers (PAs) based on GaN high-electron-mobility transistors (HEMTs). The analog compensation circuit (ACC) is supported on a charge-trapping
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 67:5249-5256
Pulsed radar amplifiers are known to present severe long-term memory effects in their pulse-to-pulse stability. These are usually attributed to electrothermal dynamics or to trapping effects originated in gallium-nitride (GaN) HEMTs. Expanding on our
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 67:288-294
In this paper, we describe a hybrid analog/digital linearization scheme for GaN high-electron-mobility transistor (HEMT)-based power amplifiers that consists of a novel analog feedforward circuit and a conventional generalized memory polynomial (GMP)
Autor:
Filipe M. Barradas, Joao L. Gomes, Pedro M. Tome, Pedro M. Cabral, Telmo R. Cunha, Jose C. Pedro, Luis C. Nunes
Publikováno v:
2021 IEEE MTT-S International Wireless Symposium (IWS).
This work is an overview of the current understanding of memory effects arising from AlGaN/GaN HEMT based RF power amplifiers. It reviews the most widely accepted physical sources of those memory effects and their impact on the amplifier's linearizab
Autor:
Filipe M. Barradas, Telmo R. Cunha, Luis C. Nunes, Joao L. Gomes, Jose C. Pedro, Pedro M. Tome
Publikováno v:
2020 IEEE/MTT-S International Microwave Symposium (IMS).
In this paper we propose an experimental method for the characterization and extraction of the time constants associated with the charge capture and emission processes of electron-trapping phenomena observed in radio-frequency (RF) power amplifiers (
Autor:
Filipe M. Barradas, Telmo R. Cunha, Pedro M. Cabral, Pedro M. Tome, Jose C. Pedro, Jose M. Gomes
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 65:5284-5297
Modern and future transmitter architectures are being driven toward multi-input multi-output (MIMO) transceivers, which make use of several radio frequency (RF) power amplifiers (PAs) to drive an antenna array. When moving to high integration scenari
Publikováno v:
2019 IEEE MTT-S International Microwave Symposium (IMS).
In this paper we describe a method for compensating the pulse-to-pulse instability of GaN high-electron-mobility transistor (HEMT)-based power amplifiers (PAs) caused by electron-trapping effects. The method consists in generating a compensation sign