X-ray coherent diffraction imaging with an objective lens: towards 3D mapping of thick polycrystals

Autor: Pedersen, Anders Filsøe, Chamard, Virginie, Detlefs, Carsten, Zhou, Tao, Carbone, Dina, Poulsen, Henning Friis

Publikováno v: Phys. Rev. Research 2, 033031 (2020)

We report on a new x-ray imaging method, which combines the high spatial resolution of coherent diffraction imaging with the ability of dark field microscopy to map grains within thick polycrystalline specimens. An x-ray objective serves to isolate a

Externí odkaz: http://arxiv.org/abs/1810.04268

X-ray coherent diffraction imaging with an objective lens: towards 3D mapping of thick polycrystals

Autor: Pedersen, Anders Filsøe, Chamard, Virginie, Detlefs, Carsten, Zhou, Tao, Carbone, Dina, Poulsen, Henning Friis

Publikováno v: Physical Review Research
Physical Review Research, American Physical Society, 2020, 2 (3), pp.033031. ⟨10.1103/PhysRevResearch.2.033031⟩
Phys.Rev.Res.
Phys.Rev.Res., 2020, 2 (3), pp.033031. ⟨10.1103/PhysRevResearch.2.033031⟩

We report on a new x-ray imaging method, which combines the high spatial resolution of coherent diffraction imaging with the ability of dark field microscopy to map grains within thick polycrystalline specimens. An x-ray objective serves to isolate a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1ee541aee6c9a4cd4a2c1993d9249373
https://hal.archives-ouvertes.fr/hal-01909165

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.

Multilayer Laue lenses at high X-ray energies: performance and applications

Autor: Murray, Kevin T., Pedersen, Anders Filsøe, Mohacsi, Istvan, Detlefs, Carsten, Morgan, Andrew J., Prasciolu, Mauro, Yildirim, Can, Simons, Hugh, Jakobsen, Anders Clemen, Chapman, Henry N., Poulsen, Henning Friis, Bajt, Saša

Publikováno v: Murray, K T, Pedersen, A F, Mohacsi, I, Detlefs, C, Morgan, A J, Prasciolu, M, Yildirim, C, Simons, H, Jakobsen, A C, Chapman, H N, Poulsen, H F & Bajt, S 2019, ' Multilayer Laue lenses at high X-ray energies: performance and applications ', Optics Express, vol. 27, no. 5, pp. 7120-7138 . https://doi.org/10.1364/OE.27.007120

X-ray microscopy at photon energies above 15 keV is very attractive for the investigation of atomic and nanoscale properties of technologically relevant structural and bio materials. This method is limited by the quality of X-ray optics. Multilayer L

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______1202::cc6b836be40a9cf0ec59da15c69cf8c1
https://orbit.dtu.dk/en/publications/db6dfa27-b5ac-476f-be40-2033097d2f45

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.