Zobrazeno 1 - 10
of 66
pro vyhledávání: '"Paweł Janus"'
Autor:
Bartosz Pruchnik, Krzysztof Kwoka, Ewelina Gacka, Dominik Badura, Piotr Kunicki, Andrzej Sierakowski, Paweł Janus, Tomasz Piasecki, Teodor Gotszalk
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 15, Iss 1, Pp 1273-1282 (2024)
Focused electron beam-induced deposition (FEBID) is a novel technique for the development of multimaterial nanostructures. More importantly, it is applicable to the fabrication of free-standing nanostructures. Experimenting at the nanoscale requires
Externí odkaz:
https://doaj.org/article/363290fd39664ea693adb047698c3626
Autor:
Bartosz Pruchnik, Karolina Orłowska, Bartosz Świadkowski, Ewelina Gacka, Andrzej Sierakowski, Paweł Janus, Teodor Gotszalk
Publikováno v:
Scientific Reports, Vol 13, Iss 1, Pp 1-9 (2023)
Abstract We present a method for the quantitative determination of the photon force (PF)—the force generated by the radiation pressure of photons reflected from the surface. We propose an experimental setup integrating innovative microelectromechan
Externí odkaz:
https://doaj.org/article/7a3cf20712664fd7882082ffbab250a5
Publikováno v:
Journal of Telecommunications and Information Technology, Iss 4 (2023)
The methods of parameter optimization in Etch3DTM simulator and the results of the comparison of simulations of silicon etching in KOH with experiments are presented. The aim of this study was to calibrate the tool to a set of process conditions that
Externí odkaz:
https://doaj.org/article/658acb09a1584613a5d0abde48947f1b
Autor:
Daniel Kopiec, Wojciech Majstrzyk, Bartosz Pruchnik, Ewelina Gacka, Dominik Badura, Andrzej Sierakowski, Paweł Janus, Teodor Gotszalk
Publikováno v:
Metrology and Measurement Systems, Vol vol. 28, Iss No 4, Pp 627-642 (2021)
In this paper, we present metrology and control methods and techniques for electromagnetically actuated microcantilevers. The electromagnetically actuated cantilevers belong to the micro electro mechanical systems (MEMS), which can be used in high re
Externí odkaz:
https://doaj.org/article/e8167a1e33684326bb9975c29c63622e
Autor:
Teodor Paweł Gotszalk, Paweł Janus, Andrzej Marek Marendziak, Piotr Czarnecki, Jacek Mikołaj Radojewski, Roman F. Szeloch, Piotr B. Grabiec, Ivo W. Rangelow
Publikováno v:
Journal of Telecommunications and Information Technology, Iss 1 (2005)
In this paper we summarize the results of our research concerning the diagnostics of micro- and nanostructure with scanning probe microscopy (SPM). We describe the experiments performed with one of the scanning probe microscopy techniques enabling al
Externí odkaz:
https://doaj.org/article/572b7720abfe4c8e916fb85bb6388fba
Autor:
Dariusz Obrebski, Mariusz Jakubowski, Michal Zbiec, Andrzej Szymanski, Krzysztof Kucharski, Cezary Kolacinski, Paweł Janus, Pawel Pienczuk
Publikováno v:
MIXDES
This paper describes the design of the 17-channel readout integrated circuit targeted to front-end operation for photodiodes array. Proposed system contains an analog frontend electronics digitally configured using built-in Serial Peripheral Interfac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ec74f3ba2850366f0056bdb95ca5d488
https://doi.org/10.23919/mixdes49814.2020.9155567
https://doi.org/10.23919/mixdes49814.2020.9155567
Publikováno v:
E3S Web of Conferences, Vol 154, p 02008 (2020)
This paper presents preliminary research of lignocellulosic biomass torrefaction by using microwave heating. The experimental setup was developed using a microwave oven with 2.45 GHz frequency. The torrefaction effect was studied by varying the micro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::92b5893fb923a0a6d6e3fe016e057bc9
https://www.e3s-conferences.org/articles/e3sconf/pdf/2020/14/e3sconf_icores2020_02008.pdf
https://www.e3s-conferences.org/articles/e3sconf/pdf/2020/14/e3sconf_icores2020_02008.pdf
Autor:
Andrzej Dzierka, P. Biczysko, Maciej Rudek, G. Jóźwiak, Paweł Janus, Teodor Gotszalk, Piotr Grabiec, Ivo W. Rangelow
Publikováno v:
Ultramicroscopy. 184:199-208
Scanning probe microscopy (SPM) encompasses several techniques for imaging of the physical and chemical material properties at nanoscale. The scanning process is based on the detection of the deflection of the cantilever, which is caused by near fiel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9af1b8d0630a573a1873a5e3e1078678
https://doi.org/10.1016/j.ultramic.2017.09.002
https://doi.org/10.1016/j.ultramic.2017.09.002
Autor:
Michał Babij, Teodor Gotszalk, Andrzej Sierakowski, Andrew Yacoot, Wojciech Majstrzyk, Piotr Grabiec, Z Ramotowski, Paweł Janus
Publikováno v:
Measurement Science and Technology. 32:065903
Atomic force microscopy enables three-dimensional high-resolution imaging of surfaces with nanoscale features. In order to obtain the quantitative information about surface geometry, the atomic force microscope’s scanning system must be calibrated.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::476593d414a07871d325ca1d8993f9c2
https://doi.org/10.1088/1361-6501/abc28a
https://doi.org/10.1088/1361-6501/abc28a
Publikováno v:
Ultramicroscopy. 221:113188
In this paper we describe the design, technology and application of a test and reference sample for calibration and characterization of scanning thermal microscopy (SThM) probes and systems. In our solution temperature field in thin film structure, w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::064ad5197fce34ab6e0693062b02d451
https://doi.org/10.1016/j.ultramic.2020.113188
https://doi.org/10.1016/j.ultramic.2020.113188