Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Pavlov, Yury"'
Publikováno v:
In Procedia Computer Science 2018 145:123-133
Autor:
Losev, Anton, Alekseev, Petr, Alexeev, Nikolay, Kulevoy, Timur, Lagov, Petr, Letovaltseva, Marta, Milyachenko, Alexandr, Pavlov, Yury, Satov, Yuri, Shumshurov, Alexander
Carbon implantation can be effectively used for axial minority charge carriers lifetime control in various silicon bulk and epitaxial planar structures. When carbon is implanted, more stable recombination centers are formed and silicon is not doped w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::63c6f3747d4eb032234fc3b95896279b
During sterilization by electron beam ozone is formed in the air, which increases the efficiency of microorganism suppression. When studying the processes of radiation sterilization, it is necessary to estimate the contribution of the chemical factor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11bdaa12d2f2388e4a41db1971ff3d7f
Autor:
Bystrov, Peter, Kozlov, Artem, Pavlov, Yury, Prokopenko, Alexander, Rozanov, Nikolay, Yakupov, Igor
Irradiation of medical products on radiation installations based on electron beam is a responsible task. To increase the quality of irradiation, continuous monitoring of the installation operation is necessary. The design of the system for monitoring
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cdbfdaf56cafa9861c0c974c30965d19
Autor:
Prokopenko, Alexander, Filippovich, Vitaly, Gordeev, Andrey, Gracheova, Anastasia, Iluhina, Natalia, Pavlov, Yury
Article is devoted to the study of the irradiation efficiency of model systems containing conditionally pathogenic microorganism by electron beams with energy of 7 and 10 MeV. The research on the effectiveness of inhibition of the initial degree of i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9aa5dbd3d20c50dabb26c0d6cfad77ba
Autor:
Pavlov, Yury, Fraser, Gordon
Publikováno v:
2012 IEEE Fifth International Conference on Software Testing, Verification & Validation; 1/ 1/2012, p777-784, 8p