Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Pavel S. Vergeles"'
Publikováno v:
Micromachines, Vol 14, Iss 6, p 1190 (2023)
The dynamics of dislocations introduced through indentation or scratching at room temperature into a few GaN layers that were grown using the HVPE, MOCVD and ELOG methods and had different dislocation densities were studied via the electron-beam-indu
Externí odkaz:
https://doaj.org/article/f9cda1a2506c44918457007d301706b5
Publikováno v:
Modern Electronic Materials, Vol 5, Iss 4, Pp 175-179 (2019)
Charging of dielectric targets by electron irradiation is a well-known phenomenon which should be taken into account in characterization of dielectric materials and coatings with electron microscopy, in electron beam lithography, in development of di
Externí odkaz:
https://doaj.org/article/014c35b19c464d0ea67dbaf109d0274d
Publikováno v:
Japanese Journal of Applied Physics; May2016, Vol. 55 Issue 5S, p1-1, 1p