Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Pavel Doleže"'
Publikováno v:
International Symposium for Testing and Failure Analysis.
Multipurpose sample holder for advanced Transmission Electron Microscopy (TEM) sample preparation which reduces cost of the tool and most importantly simplifies the workflow is introduced. Following the current demand for user-friendly interface, sem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::31e8601ec5d33af03990240a9523fa3f
https://doi.org/10.31399/asm.cp.istfa2019p0219
https://doi.org/10.31399/asm.cp.istfa2019p0219
