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of 9
pro vyhledávání: '"Pavan Kumar Vaitheeswaran"'
Publikováno v:
Algorithms, Vol 13, Iss 4, p 82 (2020)
Point projection is an important geometric need when boundaries described by parametric curves and surfaces are immersed in domains. In problems where an immersed parametric boundary evolves with time as in solidification or fracture analysis, the pr
Externí odkaz:
https://doaj.org/article/54dd2123a2b9419a82ee488cecac5384
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 13:426-443
Publikováno v:
Computational Mechanics. 66:373-390
Electromigration in electrical interconnects with high current density causes voids to form and grow near the cathode. These voids can possibly grow large enough to cause open circuit failure. The simulation of electromigration void nucleation and gr
Publikováno v:
Continuum Mechanics and Thermodynamics. 32:987-1010
In this paper, the thermodynamic configurational force associated with a moving interface is used to derive the conditions for phase growth and nucleation in bodies with multiple diffusing species and arbitrary surface stress at the phase interface.
Autor:
Y-J. Park, Jayhoon Chung, Srikanth Krishnan, Pavan Kumar Vaitheeswaran, C-S. Lee, Ganesh Subbarayan
Publikováno v:
IRPS
Design rules for specification of current densities in lines are driven by consideration of possible failure mechanisms. Under large amplitude intermittent current pulses, thermal stresses are the dominant cause for failure, with chief failure mechan
Publikováno v:
Algorithms
Volume 13
Issue 4
Algorithms, Vol 13, Iss 82, p 82 (2020)
Volume 13
Issue 4
Algorithms, Vol 13, Iss 82, p 82 (2020)
Point projection is an important geometric need when boundaries described by parametric curves and surfaces are immersed in domains. In problems where an immersed parametric boundary evolves with time as in solidification or fracture analysis, the pr
Publikováno v:
Proceedings of CAD'19.
Publikováno v:
Journal of Electronic Packaging. 140
Particulate thermal interface materials (TIMs) are commonly used to transport heat from chip to heat sink. While high thermal conductance is achieved by large volume loadings of highly conducting particles in a compliant matrix, small volume loadings
Publikováno v:
ASME 2017 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems.
Particulate thermal interface materials (TIMs) are commonly used to transport heat from chip to heat sink. While high thermal conductance is achieved by large volume loadings of highly conducting particles in a compliant matrix, small volume loadings