Zobrazeno 1 - 10
of 52
pro vyhledávání: '"Paul T. Blanchard"'
Autor:
Paul T. Blanchard, Luis Miaja-Avila, Norman A. Sanford, Brian P. Gorman, Ann N. Chiaramonti, David R. Diercks
Publikováno v:
Microsc Microanal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fadb2d1a5e46d38d4ad4f09fd01c8b99
https://pubmed.ncbi.nlm.nih.gov/35979403
https://pubmed.ncbi.nlm.nih.gov/35979403
Autor:
Matthew D. Brubaker, David R. Diercks, Norman A. Sanford, Brian P. Gorman, Kris A. Bertness, Ashwin K. Rishinaramangalam, Albert V. Davydov, Benjamin W. Caplins, Ann N. Chiaramonti, Luis Miaja-Avila, Daniel F. Feezell, Paul T. Blanchard
Publikováno v:
The Journal of Physical Chemistry C. 125:2626-2635
Laser-pulsed atom probe tomography (LAPT) is a materials characterization technique that has been widely applied in the study and characterization of III-nitride semiconductors. To date, most of th...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b765e137ba6a7adbe99b85b30e483af8
https://doi.org/10.1021/acs.jpcc.0c08753
https://doi.org/10.1021/acs.jpcc.0c08753
Autor:
Matt D, Brubaker, Kristen L, Genter, Joel C, Weber, Bryan T, Spann, Alexana, Roshko, Paul T, Blanchard, Todd E, Harvey, Kris A, Bertness
Publikováno v:
Proc SPIE Int Soc Opt Eng
GaN nanowire LEDs with radial p-i-n junctions were grown by molecular beam epitaxy using N-polar selective area growth on Si(111) substrates. The N-polar selective area growth process facilitated the growth of isolated and high-aspect-ratio n-type NW
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::49f663e9da3fbd143948e55e8e0dcc99
https://pubmed.ncbi.nlm.nih.gov/33343056
https://pubmed.ncbi.nlm.nih.gov/33343056
Electron-Enhanced Atomic Layer Deposition of Boron Nitride Thin Films at Room Temperature and 100 °C
Autor:
Jaclyn K, Sprenger, Huaxing, Sun, Andrew S, Cavanagh, Alexana, Roshko, Paul T, Blanchard, Steven M, George
Publikováno v:
J Phys Chem C Nanomater Interfaces
Electron-enhanced atomic layer deposition (EE-ALD) was used to deposit boron nitride (BN) thin films at room temperature and 100 °C using sequential exposures of borazine (B(3)N(3)H(6)) and electrons. Electron-stimulated desorption (ESD) of hydrogen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::2cc6281f056f163e90500bc8d24fd97b
https://pubmed.ncbi.nlm.nih.gov/33101567
https://pubmed.ncbi.nlm.nih.gov/33101567
Autor:
David R. Diercks, Benjamin W. Caplins, Norman A. Sanford, Ann N. Chiaramonti, Luis Miaja-Avila, Paul T. Blanchard
Publikováno v:
Ultramicroscopy
Improvements in the mass resolution of a mass spectrometer directly correlate to improvements in peak identification and quantification. Here, we describe a post-processing technique developed to increase the quality of mass spectra of strongly insul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b830ba85d06a3e15d4f57558d2c9e37d
https://europepmc.org/articles/PMC7536741/
https://europepmc.org/articles/PMC7536741/
Autor:
Norman A. Sanford, Benjamin W. Caplins, David R. Diercks, Brian P. Gorman, Paul T. Blanchard, Ann N. Chiaramonti, Luis Miaja-Avila
Publikováno v:
Microsc Microanal
This paper describes initial experimental results from an extreme ultraviolet (EUV) radiation-pulsed atom probe microscope. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV photon energy), obtained through high harmonic gener
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dfa5953e33b2be249a03c7db6c330b95
https://europepmc.org/articles/PMC7195254/
https://europepmc.org/articles/PMC7195254/
Autor:
Desmond E. Moser, Florian Vogel, Julie M. Cairney, Katherine P. Rice, Michael P. Moody, Daniel K. Schreiber, Karen Kruska, Sandra Piazolo, Denis Fougerouse, S. Pedrazzini, Ann N. Chiaramonti, Paul T. Blanchard, Steven M. Reddy, Paul A. J. Bagot, David W. Saxey, F. Exertier, Gregory B. Thompson, David A. Reinhard, Jing Wang, Gianluigi A. Botton, Zirong Peng, A. La Fontaine, Baptiste Gault, Elena Belousova, C. Corcoran, Brian Langelier
Publikováno v:
Chemical Geology. 495:27-35
In recent years, atom probe tomography (APT) has been increasingly used to study minerals, and in particular the mineral zircon. Zircon (ZrSiO4) is ideally suited for geochronology by utilising the U-Th-Pb isotope systems, and trace element compositi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::24b42e51904e3e81be1956e388a74270
https://doi.org/10.1016/j.chemgeo.2018.07.031
https://doi.org/10.1016/j.chemgeo.2018.07.031
Electron-Enhanced Atomic Layer Deposition of Boron Nitride Thin Films at Room Temperature and 100 °C
Autor:
Paul T. Blanchard, Jaclyn K. Sprenger, Andrew S. Cavanagh, Huaxing Sun, Steven M. George, Alexana Roshko
Publikováno v:
The Journal of Physical Chemistry C. 122:9455-9464
Electron-enhanced atomic layer deposition (EE-ALD) was used to deposit boron nitride (BN) thin films at room temperature and 100 °C using sequential exposures of borazine (B3N3H6) and electrons. Electron-stimulated desorption (ESD) of hydrogen surfa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c75d79803a92028272d1fa7327a9d7c6
https://doi.org/10.1021/acs.jpcc.8b00796
https://doi.org/10.1021/acs.jpcc.8b00796
Autor:
Paul T. Blanchard, David R. Diercks, Luis Miaja-Avila, Ann N. Chiaramonti, Norman A. Sanford, Benjamin W. Caplins
Publikováno v:
Microscopy and Microanalysis. 26:2880-2881
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c938a4a0138433427981b08c9aa62f9
https://doi.org/10.1017/s1431927620023089
https://doi.org/10.1017/s1431927620023089
Autor:
Alexana Roshko, Matthew D. Brubaker, Paul T. Blanchard, Roy H. Geiss, Todd E. Harvey, Kris A. Bertness, Igor Levin
Publikováno v:
Journal of Materials Research. 32:936-946
A comparison of two electron microscopy techniques used to determine the polarity of GaN nanowires is presented. The techniques are convergent beam electron diffraction (CBED) in TEM mode and annular bright field (ABF) imaging in aberration corrected
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7d9a8ba41f8e82a4c892347f77eec360
https://doi.org/10.1557/jmr.2016.443
https://doi.org/10.1557/jmr.2016.443