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pro vyhledávání: '"Paul Sunier"'
Autor:
Edward Beam, U. Chowdhury, Carlo Floresca, Tony Balistreri, S.Y. Park, C. Lee, Jose L. Jimenes, Moon J. Kim, Paul Sunier
Publikováno v:
2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop].
HRTEM observation was conducted to find evidence of physical degradation in AlGaN/GaN heterostructure HEMT devices after life time testing. A strong relationship between electrical degradation and defects formation near the gate edge was observed. De
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c65a837d3f1a8ba500c24d6cef8022ac
https://doi.org/10.1109/rocs.2008.5483616
https://doi.org/10.1109/rocs.2008.5483616
