Zobrazeno 1 - 10
of 70
pro vyhledávání: '"Paul Saunier"'
Autor:
Aaron R. Arehart, Ronald D. Schrimpf, Steven A. Ringel, Daniel M. Fleetwood, Erin C. H. Kyle, Paul Saunier, Yevgeniy Puzyrev, Stephen W. Kaun, Sokrates T. Pantelides, Jin Chen, En Xia Zhang, James S. Speck, C. Lee
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 16:282-289
A small degradation of threshold voltage and a significant reduction in dc and RF transconductance are observed for AlGaN/GaN high-electron-mobility transistors fabricated via three different process techniques and subjected to high voltage stress in
Autor:
Paul Saunier, Daniel M. Fleetwood, Yevgeniy Puzyrev, Sokrates T. Pantelides, Steven A. Ringel, Rong Jiang, Michael W. McCurdy, En Xia Zhang, Aaron R. Arehart, Jin Chen, Ronald D. Schrimpf, C. Lee
Publikováno v:
IEEE Transactions on Nuclear Science. 62:2423-2430
The sensitivity of GaN/AlGaN HEMTs to 1.8 MeV proton irradiation is greatly enhanced by biasing the devices during irradiation and/or applying high field stress before irradiation. The resulting defect energy distributions are evaluated after irradia
Autor:
Paul Saunier
Publikováno v:
International Conference on Millimeter and Submillimeter Waves and Applications 1994.
A 100-200-400A‚µm pHEMT amplifier has been developed for Ka-Band operation. This amplifier has achieved the state-of-the-art efficiency of 40% with 235 mW output power and 20.7 dB gain at 31 GHz. Production of variations of this amplifier in qua
Autor:
Debdeep Jena, Ronghua Wang, Patrick Fay, Jia Guo, Bo Song, Edward Beam, Berardi Sensale-Rodriguez, Zongyang Hu, Yuanzheng Yue, Shiping Guo, Faiza Afroz Faria, Andrew Ketterson, Paul Saunier, Xiang Gao, Huili Grace Xing, Michael L. Schuette
Publikováno v:
IEEE Transactions on Electron Devices. 61:747-754
The effects of fringing capacitances on the high-frequency performance of T-gate GaN high-electron mobility transistors (HEMTs) are investigated. Delay time components have been analyzed for gate-recessed InAlN/GaN HEMTs with a total gate length of 4
Autor:
Shiping Guo, Tian Fang, Michael L. Schuette, Patrick Fay, Jia Guo, Berardi Sensale-Rodriguez, Edward Beam, Guowang Li, Huili Grace Xing, Debdeep Jena, Gregory L. Snider, Ronghua Wang, Jai Verma, Andrew Ketterson, Paul Saunier, Xiang Gao
Publikováno v:
Solid-State Electronics. 80:67-71
Delay analysis providing an alternative physical explanation on carrier transport, which may be more applicable to high electron mobility transistor (HEMT) channels with moderate carrier mobilities, has been applied to enhancement-mode (E-mode) and d
Autor:
Edward Beam, Paul Saunier, David Kopp, Patrick Fay, Wayne Johnson, Oleg Laboutin, Tomas Palacios, Yu Cao, Michael L. Schuette, Andrew Ketterson, Dong Seup Lee
Publikováno v:
physica status solidi c. 10:827-830
This paper reports depletion-mode In0.13Al0.83Ga0.04N/GaN high electron mobility transistors (HEMTs) on a SiC substrate with a record current gain cutoff frequency (fT) of 317 GHz. Thanks to the combination of high electron mobility, regrown n+ InGaN
Publikováno v:
2016 IEEE International Reliability Physics Symposium (IRPS).
GaN-based high electron mobility transistors (HEMTs) were subjected to DC-based accelerated life testing to determine which defect levels form or are activated, and how they impact the static and dynamic HEMT performance. The primary static changes w
Autor:
Lin Zhou, Paul Saunier, Shiping Guo, Xiang Gao, Daniel Gorka, David J. Smith, Andrew Ketterson
Publikováno v:
physica status solidi c. 8:2081-2085
High performance AlInN/AlN HEMTs with Ga free barrier and sharp interface have been demonstrated with excellent control of sheet resistance and uniformity. As the total barrier thickness reduce to below 4 nm, the depletion of 2DEG channel start to ac
Autor:
Daniel Gorka, Paul Saunier, Ming Pan, Mark Oliver, Andrew Ketterson, Michael L. Schuette, Xiang Gao
Publikováno v:
physica status solidi c. 11:495-497
We report transport properties measured from quaternary barrier InAlGaN high electron mobility transistor wafers on SiC substrates. With similar barrier thicknesses, higher mobility and sheet charge density were both demonstrated by a strained barrie
Autor:
Paul Saunier, Hua-Quen Tserng, Christi Campbell, T. Balisteri, V. Williams, Ming-Yih Kao, C. Lee
Publikováno v:
IEEE Journal of Solid-State Circuits. 44:2640-2647
The design and performance of a wideband power amplifier MMIC suitable for electronic warfare (EW) systems and other wide bandwidth applications is presented. The amplifier utilizes dual field plate 0.25- mum GaN on SiC device technology integrated i