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pro vyhledávání: '"Paul P. Donohue"'
Autor:
Paul P. Donohue, Mark A. C. Harper, Carl J. Anthony, Michael Andrew Todd, Jason C. Jones, Zhaorong Huang
Publikováno v:
Integrated Ferroelectrics. 49:233-243
Materials merit figures nearly 4 times that of PZT have been reported for sputtered lead scandium tantalate thin films. To achieve the required PST ferroelectric crystal phase, post-deposition annealing to temperatures above that allowable for silico
Publikováno v:
Integrated Ferroelectrics. 35:115-125
This paper describes the deposition of thin film lead scandium tantalate (Pb2ScTaO6) using a novel two target sputtering technique and reports on the effect of post-deposition annealing. The films are deposited on platinum-coated silicon wafers at 30
Autor:
Carl J. Anthony, Michael Andrew Todd, Paul P. Donohue, Mark A. C. Harper, Rex Watton, A. G. Brown
Publikováno v:
Integrated Ferroelectrics. 41:25-34
There is interest in ferroelectric thin films for uncooled IR detector applications. Currently the processing of these devices takes a fully integrated approach where the thin films are deposited directly onto underlying CMOS readout circuitry, there
Publikováno v:
SPIE Proceedings.
This paper reviews the use of thin film ferroelectric materials for application in microbolometer infrared detector arrays. A key issue is the need for high temperature processing to achieve the required ferroelectric crystal phase. Results of therma
Publikováno v:
SPIE Proceedings.
The development of a Petzval objective lens which is passively athermalized over the temperature range minus 20 degrees Celsius to plus 50 degrees Celsius is described. The lens is compatible with a latest generation uncooled staring array imager ope
Autor:
Kevin St. John Murphy, Qi He Hong, A. Marshall, Alan H. Lettington, John C. MacDonald, Paul P. Donohue
Publikováno v:
SPIE Proceedings.
The use of focal plane arrays (FPAs) in infrared imaging systems is becoming increasingly important. There are problems, however, in measuring their modulation transfer function (MTF) and their minimum resolvable temperature difference (MRTD) since t
Autor:
Peter J. Wright, Carl J. Anthony, Michael J. Crosbie, Paul P. Donohue, Penelope A. Lane, Michael A. Todd
Publikováno v:
Journal of Materials Chemistry; Oct2004, Vol. 14 Issue 21, p3251-3258, 8p
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