Zobrazeno 1 - 10
of 221
pro vyhledávání: '"Paul Mertens"'
14th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (14th UCPSS 2018)Selected, peer reviewed papers from the 14th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (14th UCPSS 2018), September 3-
Selected, peer reviewed papers from the 12th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS), September 21-24, 2014, Brussels, Belgium
Selected, peer reviewed papers from the 11th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS), September 17-19, 2012, Gent, Belgium
Selected, peer reviewed papers from the 10th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS), September 20-22, 2010, Ostend, Belgium
Publikováno v:
Particles on Surfaces: Detection, Adhesion and Removal, Volume 7 ISBN: 9780429070716
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a9a37be8427cb1bd3beb15fa954d9a98
https://doi.org/10.1201/9780429070716-29
https://doi.org/10.1201/9780429070716-29
Autor:
Paul Mertens
Publikováno v:
ECS Transactions. 92:237-244
The build-up of gaseous contamination from the ambient air on the surface of a wafer as a function of exposure time is quantitatively modelled. The calculation shows that the transport in the ambient air plays a major role.
Autor:
Emanuele Cornagliotti, Ali Hajjiah, A. Uruena, Paul Mertens, Jef Poortmans, Michael Haslinger, Joachim John, M. Soha, Loic Tous
Publikováno v:
Solar Energy Materials and Solar Cells. 194:83-88
Further increasing the conversion efficiency of silicon solar cells by advanced solar cell concepts like SHJ (Silicon Hetero-Junction), PERT (Passivated Emitter Rear Totally diffused), IBC (Interdigitated Back-Contact), requires a highly controlled s
Selected peer-reviewed full text papers from the 16th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS 2023)Selected peer-reviewed full text papers from the 16th International Symposium on Ultra Clean Processing of S
We investigate the internal flow pattern of an evaporating droplet using tomographic particle image velocimetry (PIV) when the contact line non-uniformly recedes. We observe a three-dimensional azimuthal vortex pair while the contact line non-uniform
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e71ed59f6637e9f3424a3e627b3cb443
http://arxiv.org/abs/2005.07881
http://arxiv.org/abs/2005.07881
Publikováno v:
Solid State Phenomena. 282:295-299
Trace metal impurities are known to severely degrade the performance of silicon solar cells. The effect of Nickel dissolved in dilute cleaning solutions was studied in detail. Clean wafers were exposed to these mixtures.The resulting surface concentr