Zobrazeno 1 - 10 of 224 pro vyhledávání: '"Paul LeRoux"'
1
Akademický článek
A Review of Semiconductor Based Ionising Radiation Sensors Used in Harsh Radiation Environments and Their Applications
Autor: Arijit Karmakar, Jialei Wang, Jeffrey Prinzie, Valentijn De Smedt, Paul Leroux
Publikováno v: Radiation, Vol 1, Iss 3, Pp 194-217 (2021)
This article provides a review of semiconductor based ionising radiation sensors to measure accumulated dose and detect individual strikes of ionising particles. The measurement of ionising radiation (γ-ray, X-ray, high energy UV-ray and heavy ions,
Externí odkaz: https://doaj.org/article/f2cbb479f3eb4cf5adf55f78ef21aa45
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2
Akademický článek
Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions
Autor: Ygor Q. Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
Publikováno v: Aerospace, Vol 7, Iss 2, p 12 (2020)
Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event Transient (SET) effects were considered irrelevant compared to the data rupture caused by Single-Event Upset (SEU) effects. However, the importance of con
Externí odkaz: https://doaj.org/article/e03cc6de11ca46b38f5437bd3ff1379f
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5
A Review of Semiconductor Based Ionising Radiation Sensors Used in Harsh Radiation Environments and Their Applications
Autor: Jeffrey Prinzie, Paul Leroux, Valentijn De Smedt, Jialei Wang, Arijit Karmakar
Publikováno v: Radiation, Vol 1, Iss 18, Pp 194-217 (2021)
This article provides a review of semiconductor based ionising radiation sensors to measure accumulated dose and detect individual strikes of ionising particles. The measurement of ionising radiation (γ-ray, X-ray, high energy UV-ray and heavy ions,
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e80fd9b88d65fdbac7308b03efd746f7
https://www.mdpi.com/2673-592X/1/3/18
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6
Study of SEU Sensitivity of SRAM-Based Radiation Monitors in 65-nm CMOS
Autor: Paul Leroux, Sam Thys, Jeffrey Prinzie, Ruben Garcia Alia, Andrea Coronetti, Jialei Wang
Publikováno v: IEEE Transactions on Nuclear Science
This article presents a static random access memory (SRAM)-based flexible radiation monitor. The monitor was fabricated in a 65-nm CMOS technology and it is designed as an application-specific integrated circuit, which comprises 768k bits SRAM cell m
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ac7f4e32276a0de63ed09a885e05d1a1
https://doi.org/10.1109/tns.2021.3072328
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7
Tradeoffs in Time-to-Digital Converter Architectures for Harsh Radiation Environments
Autor: Jeffrey Prinzie, Bjorn Van Bockel, Paul Leroux
Publikováno v: IEEE Transactions on Instrumentation and Measurement. 70:1-10
Performance degradation of standard time-to-digital converters (TDCs) is inevitable due to the effects of ionizing radiation. In this article, the tradeoffs of different mitigation techniques for TDC architectures are presented. As the effect of radi
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e59b10dfd2720251e4bc8b4a9ab7eaf2
https://doi.org/10.1109/tim.2021.3100355
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8
Radiation-Tolerant Digitally Controlled Ring Oscillator in 65-nm CMOS
Autor: Stefan Biereigel, Szymon Kulis, Paul Leroux, Paulo Moreira, Jeffrey Prinzie
This article presents a radiation-tolerant digitally controlled complementary metal–oxide–semiconductor (CMOS) ring oscillator design suitable for all-digital phase-locked loop (ADPLL) implementations. To address the challenges presented by harsh
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6204a61e76d1da19cd0a165f25d68db6
http://cds.cern.ch/record/2801571
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10
Radiation-tolerant all-digital PLL/CDR with varactorless LC DCO in 65 nm CMOS
Autor: Alexander Kolpin, Paul Leroux, Jeffrey Prinzie, Szymon Kulis, Stefan Biereigel, Paulo Moreira
Publikováno v: Electronics, Vol 10, Iss 2741, p 2741 (2021)
Electronics
Volume 10
Issue 22
Electronics 10 (22): 2741 (2021)
This paper presents the first fully integrated radiation-tolerant All-Digital Phase-Locked Loop (PLL) and Clock and Data Recovery (CDR) circuit for wireline communication applications. Several radiation hardening techniques are proposed to achieve st
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d683e47c6d28d4f3e98b991c1de896d5
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