Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Paul Karakatsanis"'
Autor:
Helene Casalta, Andreas Hirsch, Xavier Camps, Otto Vostrowsky, Thomas M. Bayerl, Michael Hetzer, Paul Karakatsanis
Publikováno v:
The Journal of Physical Chemistry A. 104:5437-5443
Lipo-fullerenes are lipophilic C60 derivatives (six pairs of alkyl chains symmetrically grafted to the C60 cage) that intercalate in phospholipid bilayers by the formation of rodlike structures of nanoscopic dimensions. Proton NMR measurements in the
Autor:
Thomas M. Bayerl, Paul Karakatsanis
Publikováno v:
Physical Review E. 54:1785-1790
For the first time, to our knowledge, self-diffusion of lipids and water in lipid bilayers is studied by proton NMR measurements in the fringe field of a superconducting magnet. Highly oriented multilayer stacks of dipalmitoyl phosphatidylcholine wer
Autor:
Ian Stobert, Vyacheslav Rovner, Tejas Jhaveri, Paul Karakatsanis, Lars W. Liebmann, Andrzej J. Strojwas, Larry Pileggi
Publikováno v:
SPIE Proceedings.
Cost and complexity associated with OPC and masks are rapidly increasing to the point that they could limit technology scaling in the future. This paper focuses on demonstrating the advantages of regular design fabrics for OPC simplification to enabl
Publikováno v:
SPIE Proceedings.
We present a new method of sidelobe suppressor placement based on fast lithographic simulation. Experimental results of printing 0.18 micron contact holes using a 5.5 percent transmittance attenuated phase shift mask with different settings of partia
Publikováno v:
SPIE Proceedings.
The paper describes the extension of optical proximity correction (OPC), which is well established for conventional chromium-on-glass mask printing, to alternating phase shift masks (altPSM). Aerial image simulation of various situations of light-fie
Publikováno v:
SPIE Proceedings.
The pattern transfer process from the chip layout data to the structures on the finished wafer consists of many process steps. Although desired, none of these steps is linear in all aspects of the pattern transfer. Approaching the process limits due
Conference
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Conference
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