Reviewers

Autor: Peter E. Andersen, William B. Armstrong, Leon A. Assael, Stephen W. Bayles, Peter C. Belafsky, Manuel Bernal-Sprekelsen, Nasir I. Bhatti, Brian B. Burkey, Bruce H. Campbell, William R. Carroll, Salvatore M. Caruana, Claudio R. Cernea, Francisco J. Civantos, Gary L. Clayman, James I. Cohen, Seth M. Cohen, Ted A. Cook, Robin T. Cotton, Mark S. Courey, Bruce J. Davidson, Terry A. Day, Daniel G. Deschler, Gianlorenzo Dionigi, Paul James Donald, David W. Eisele, D. Gregory Farwell, Fred G. Fedok, Robert L. Ferris, Paul W. Flint, Jeremy L. Freeman, Paul L. Friedlander, Neal Futran, Markus Gapany, C. Gaelyn Garrett, Eric M. Genden, Helmuth Goepfert, Andrew N. Goldberg, Neil D. Gross, Patrick J. Gullane, Gady Har-El, Amy C. Hessel, Peter A. Hilger, Frans J.M. Hilgers, Henry T. Hoffman, F. Christopher Holsinger, David B. Hom, David Howard, Jonathan Irish, Jonas T. Johnson, Larry R. Kaiser, Emad Kandil, Dennis Kraus, Ronald B. Kuppersmith, Ollivier Laccourreye, Eric S. Lambright, Jeffrey E. Lee, John P. Leonetti, Celestino Pio Lombardi, William M. Lydiatt, Jeffery Scott Magnuson, Robert H. Maisel, Rosario Marchese-Ragona, Robert G. Martindale, Sam J. Marzo, Timothy M. McCulloch, Andrew J. McWhorter, Jesus E. Medina, Eduardo Méndez, Albert L. Merati, Tanya K. Meyer, Paolo Miccoli, Henry A. Milczuk, Oleg Militsakh, Eric J. Moore, Meijin Nakayama, Roger C. Nuss, Kerry D. Olsen, Steven M. Olsen, Lisa A. Orloff, Robert H. Ossoff, Giorgio Peretti, Nancy D. Perrier, Cesare Piazza, Joe B. Putnam, Gregory W. Randolph, Marc Remacle, Alan T. Richards, William J. Richtsmeier, John A. Ridge, Clark A. Rosen, Eben L. Rosenthal, John R. Saunders, Joshua S. Schindler, David E. Schuller, Aniel Sewnaik, Ashok R. Shaha, Maisie Shindo, William W. Shockley, James Sidman, C. Blake Simpson, Catherine F. Sinclair, James D. Smith, Timothy L. Smith, Carl Henry Snyderman, Robert A. Sofferman, Jeffrey D. Spiro, Wolfgang Steiner, David J. Terris, Ralph P. Tufano, Joseph Valentino, Isabel Vilaseca, Stephen J. Wang, Mark K. Wax, Randal S. Weber, Richard J. Wong, Steven M. Zeitels

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e73b4d2041a7477024c7810f6159103c
https://doi.org/10.1016/b978-1-4160-3368-4.00067-6