Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Paul Gutwin"'
Publikováno v:
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
New tools and methodologies are fused with conventional elements of the process-design-kit (PDK) and design enablement to introduce a rigorous yet fast and agile technology prototyping platform. This design technology cooptimization (DTCO) solution r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::916a76e562901d13ea67e443e7c2a517
https://doi.org/10.23919/sispad49475.2020.9241669
https://doi.org/10.23919/sispad49475.2020.9241669
Publikováno v:
SPIE Proceedings.
As pitch scaling is becoming constrained not only by lithographic resolution limits but alos by fundamental device and interconnect challenges the semiconductor industry has turned to cell-height reduction as a means of achieving competitive area sca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dd136de4f2be1bd63a2afc7c6851b7b7
https://doi.org/10.1117/12.2259981
https://doi.org/10.1117/12.2259981
Publikováno v:
SPIE Proceedings.
This paper reviews the most critical components of a ‘holistic’ DTCO flow for an advanced technology node and in doing so quantifies the differences between 7nm technology node definitions implemented with extreme ultraviolet and 193nm immersion
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af14c1458b31bde642c2af2130b3ae8c
https://doi.org/10.1117/12.2175509
https://doi.org/10.1117/12.2175509
Publikováno v:
SPIE Proceedings.
This paper reviews the escalation in design constraints imposed on 2 nd level wiring by multiple patterning exposure techniques in the 10NM technology node (i.e. ~45nm wiring pitch) relative to the 14NM technology node (i.e. 64nm wiring pitch). Speci
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::43fc14c7138a778fd22a7cd507ba4c6e
https://doi.org/10.1117/12.2045958
https://doi.org/10.1117/12.2045958
Publikováno v:
Proceedings of the 34th Design Automation Conference; 1997, pi-xxvix, 1p
Autor:
Patrick C. McGeer, Robert K. Brayton
This book is an extension of one author's doctoral thesis on the false path problem. The work was begun with the idea of systematizing the various solutions to the false path problem that had been proposed in the literature, with a view to determinin
