Zobrazeno 1 - 10
of 43
pro vyhledávání: '"Paul E. Murphy"'
Autor:
Paul E. Murphy, Chris Supranowitz
Publikováno v:
OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT).
Long radius of curvature surfaces (>1 m) often require custom transmission spheres or a long interference cavity. Subaperture stitching interferometry can significantly expand testability of such long radii using standard transmission elements.
Publikováno v:
Optifab 2019.
Fizeau interferometry is a flexible tool for optical surface metrology. Different transmission spheres (TSs) enable testing most spherical surfaces, and selecting a TS to measure form irregularity of a given surface is straightforward. New applicatio
Publikováno v:
Optical Design and Fabrication 2019 (Freeform, OFT).
Optical surface measurements include alignment error from rigid body position uncertainty. Extracting irregularity from the measurement is straightforward for spheres. We examine challenges when fitting alignment error on aspheres and freeforms.
Autor:
Paul E. Murphy
Publikováno v:
Optifab 2017.
Aspheric surfaces can provide substantial improvements to optical designs, but they can also be difficult to manufacture cost-effectively. Asphere metrology contributes significantly to this difficulty, especially for high-precision aspheric surfaces
Publikováno v:
Optifab 2017.
Recent advances in polishing and metrology have addressed many of the challenges in the fabrication and metrology of freeform surfaces, and the manufacture of these surfaces is possible today. However, achieving the form and mid-spatial frequency (MS
Autor:
Paul E. Murphy
Publikováno v:
Optical Design and Fabrication 2017 (Freeform, IODC, OFT).
Publikováno v:
SPIE Proceedings.
As applications for freeform optics continue to grow, the need for high-precision metrology is becoming more of a necessity. Currently, coordinate measuring machines (CMM) that implement touch probes or optical probes can measure the widest ranges of
Autor:
Marc Tricard, Paul E. Murphy, Andrew Kulawiec, M. Bauer, Gary DeVries, D. Miladinovich, Jon Fleig, Greg Forbes
Publikováno v:
CIRP Annals. 59:547-550
Originally, subaperture stitching interferometry enabled full-aperture measurement of large-aperture spheres and flats using 4″ or 6″ interferometers and transmission elements. Later, mild aspheric surfaces could be measured using the same fundam
Autor:
Paul E. Murphy, Gary DeVries
Publikováno v:
SPIE Proceedings.
To obtain higher spatial resolution interferometric measurements, users of optical shop interferometers generally want to obtain the highest possible number of pixels in the field of view. When the optical surface being tested does not fill the inter
Autor:
Paul E. Murphy, Christopher A. Hall
Publikováno v:
SPIE Proceedings.
Surfaces are commonly specified with peak to valley (PV) and root-mean-square (rms) requirements for surface form and roughness, describing surface quality with a few simple numbers. These specs ignore lateral feature sizes between form and roughness