Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Paul Dudek"'
Autor:
Sylwia Popek-Marciniec, Wojciech Styk, Magdalena Wojcierowska-Litwin, Aneta Szudy-Szczyrek, Paul Dudek, Grazyna Swiderska-Kolacz, Joanna Czerwik-Marcinkowska, Szymon Zmorzynski
Publikováno v:
Journal of Clinical Medicine, Vol 12, Iss 6, p 2384 (2023)
(1) Background: Chemokines and chemokine receptors play an important role in tumor development. The aim of this study was to check the significance of CCL5 and CCR1 variants with response rate, survival, and the level of regulated on activation, norm
Externí odkaz:
https://doaj.org/article/22200594fa9e476fa12bd0ea19d82fab
Autor:
Paul Dudek
Publikováno v:
Funding International Development Organizations ISBN: 9789004460010
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0fc22bd5cff2e888b59fee88b2589392
https://doi.org/10.1163/9789004460010_007
https://doi.org/10.1163/9789004460010_007
Publikováno v:
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC).
Publikováno v:
2019 IEEE Radiation Effects Data Workshop.
This paper explores the combined effects of total ionizing dose and displacement damage caused by 250 MeV protons on the Texas Instruments UC1875 controller. Two fluences – 4×1011 and 1×1012 protons/cm2 – were used for this test.
Publikováno v:
2019 IEEE Radiation Effects Data Workshop.
This paper explores the combined effects of total ionizing dose and displacement damage caused by 250 MeV protons on the Broadcom HCPL-625K optocoupler. Proton fluences up to 4x1012 were used for this radiation test.
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
This paper explores the combined effects of total ionizing dose and displacement damage caused by 250 MeV protons on the Texas Instruments UC1708 Power Driver. Two fluences − 4×1011 and 1×1012 protons/cm2 — were used for this test.
Autor:
Paul Dudek, Kodie Altvater, Douglas Jaeger, John Lindley, Brainton Song, James Hack, Deas Brown, Thomas Tittel, Ellwood Lane
Publikováno v:
2016 IEEE Radiation Effects Data Workshop (REDW).
This paper describes the methodology and test results from heavy ion and proton testing of the Micron 4 Gb NAND flash memory, with particular attention to characterization of the transient high current effect previously observed.
Autor:
Paul Dudek
Publikováno v:
Proceedings of the ASIL Annual Meeting. 97:269-272
Autor:
Ralph M. Turner, Paul Dudek
Publikováno v:
Measuring patient changes in mood, anxiety, and personality disorders: Toward a core battery.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::173f69f02545400eb3cc218816afaef2
https://doi.org/10.1037/10232-016
https://doi.org/10.1037/10232-016