Zobrazeno 1 - 10
of 52
pro vyhledávání: '"Paul Denham"'
Autor:
Paul Denham, Pietro Musumeci
Publikováno v:
Instruments, Vol 7, Iss 4, p 49 (2023)
We present an envelope equation-based approach to obtain analytical scaling laws for the shortest pulse length achievable using radiofrequency (RF)-based bunch compression. The derived formulas elucidate the dependencies on the electron beam energy a
Externí odkaz:
https://doaj.org/article/c16fed14c4454773991715a546fd3926
Autor:
J. Peter White, Timothy Paul Denham
1. Early Agriculture: Recent Conceptual and Methodological Developments 2. An Evolutionary Continuum of Plant-People Interaction (1989) 3. Darwinism and its Role in the Explanation of Domestication (1989) 4. Non-Affluent Foragers: Resource Availabili
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::278115c99fc31f360a7d3cf0187e2efd
https://doi.org/10.4324/9781003060765
https://doi.org/10.4324/9781003060765
Autor:
Pietro Musumeci, Paul Denham
In this paper, we discuss effects of space charge fields on imaging performance in a single shot time-resolved electron microscope (TEM). Using a Green's function perturbation method, we derive analytical estimates for the effects of space charge non
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::138ffd1b469234228c61ff5f2a5318a6
http://arxiv.org/abs/2010.04152
http://arxiv.org/abs/2010.04152
Publikováno v:
Monthly Notices of the Royal Astronomical Society. 482:4146-4154
Recent observational campaigns have shown that multi-planet systems seem to be abundant in our Galaxy. Moreover, it seems that these systems might have distant companions, either planets, brown-dwarfs or other stellar objects. These companions might
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::306a3fe9bbdb17e0586b989a73068b69
https://doi.org/10.1093/mnras/sty2830
https://doi.org/10.1093/mnras/sty2830
Publikováno v:
Optics Communications. 234:53-62
Scanning illumination systems provide for a powerful and flexible means of controlling illumination coherence properties. In these systems, the desired illumination divergence is synthesized through a scanning process. This method has recently been u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03e3471dc540070b05eff95b5a26db9a
https://doi.org/10.1016/j.optcom.2004.02.021
https://doi.org/10.1016/j.optcom.2004.02.021
Publikováno v:
Optics Communications. 212:225-233
A crucial component to many synchrotron beamlines is the Kirkpatrick–Baez system typically used to condense the synchrotron source to a small illumination spot. The performance of this compound optic often dictates the performance of the entire exp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::293643e0eda03bf8dad49c97ab9f36df
https://doi.org/10.1016/s0030-4018(02)02021-7
https://doi.org/10.1016/s0030-4018(02)02021-7
Autor:
Paul Denham
Publikováno v:
ESC: English Studies in Canada. 28:782-790
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::01bb46c35706f1a5a27e4c4e8bb07d22
https://doi.org/10.1353/esc.2002.0026
https://doi.org/10.1353/esc.2002.0026
Autor:
Paul Denham
Publikováno v:
ESC: English Studies in Canada. 26:362-366
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::993fa28836b80c70fd66e1a46f0b0b5b
https://doi.org/10.1353/esc.2000.0030
https://doi.org/10.1353/esc.2000.0030
Autor:
Paul Denham
Publikováno v:
ESC: English Studies in Canada. 24:487-490
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bbc7ce0aaf1baf1f2219246a04a06cc8
https://doi.org/10.1353/esc.1998.0032
https://doi.org/10.1353/esc.1998.0032
Autor:
Gideon Jones, Andrew Grenville, Senajith Rekawa, Dominic Ashworth, Suchit Bhattari, Lorie Mae Baclea-an, Jason K. Stowers, Paul Denham, Christopher L. Anderson, Rene Claus, Ken Murayama, Hiroki Nakagawa, Rikos Chao, Patrick P. Naulleau, Ken Goldberg, Ryan Miyakawa
Publikováno v:
SPIE Proceedings.
EUV exposures at the SEMATECH Berkeley Microfield Exposure Tool have demonstrated patterning down to 15 nm half pitch in a chemically amplified resist at a dose of 30 mJ/cm2. In addition, the sensitivity of two organic chemically amplified EUV resist
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b116626180c1b10f04feafedd5516d2
https://doi.org/10.1117/12.917386
https://doi.org/10.1117/12.917386