Bank profitability and economic growth

Autor: Laurent Weill, Paul-Olivier Klein

Publikováno v: Quarterly Review of Economics and Finance
Quarterly Review of Economics and Finance, 2022, 84, pp.183-199. ⟨10.1016/j.qref.2022.01.009⟩

Is bank profitability beneficial for economic growth? While policymakers have shown major concerns for low levels of bank profitability, the influence of bank profitability on economic growth remains an open question. While it can favor economic grow

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::445adfa0cbb4e8c037ffcc6a67c76429
https://doi.org/10.1016/j.qref.2022.01.009

Islamic Bonds and the Price of Risk

Autor: Shee-Yee Khoo, Paul-Olivier Klein

Publikováno v: SSRN Electronic Journal.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a72f69884a691195e1d2baf6f661a08d
https://doi.org/10.2139/ssrn.4457064

Does relationship lending help firms to ask for credit? European cross-country evidence

Autor: Jérémie Bertrand, Marieke Delanghe, Paul-Olivier Klein

Publikováno v: Economic Modelling. 124:106303

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f558f0379079fa6e31439bd2544898e0
https://doi.org/10.1016/j.econmod.2023.106303

Creditor information registries and relationship lending

Autor: Jérémie Bertrand, Paul-Olivier Klein

Publikováno v: International Review of Law and Economics
International Review of Law and Economics, 2021, 65, pp.105966-. ⟨10.1016/j.irle.2020.105966⟩
International Review of Law and Economics, Elsevier, 2021, 65, pp.105966-. ⟨10.1016/j.irle.2020.105966⟩

Banks rely on information to assess the creditworthiness of borrowers. They can secure this information in two ways: on the one hand, they can access public information on the firm from credit databases. On the other hand, they can build a relationsh

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9d665de3dcbd5a872c84d217fd8bdf7f
https://hal.science/hal-03493585

Depth Profiling of Carrier Lifetime in Thick 4H-SiC Epilayers Using Two-Photon Absorption

Autor: Nadeemullah A. Mahadik, Paul B. Klein, Robert E. Stahlbush, Ani Khachatrian, Stephen P. Buchner

Publikováno v: Materials Science Forum. 924:265-268

Depth profiling of the ambipolar carrier lifetime was performed in n-type, 140mm thick silicon carbide (SiC) epilayer using excitation by two-photon absorption (TPA) with a pulsed 586nm laser, and confocal measurement of time resolved photoluminescen

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d059509b470e0e69793f6ee1fe885a0c
https://doi.org/10.4028/www.scientific.net/msf.924.265