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ESSDERC
Electrostatic discharge (ESD) can be considered as one of the main reliability risks for modern electronic systems which causes failure of semiconductor devices by an over current effect. One of the dominant failure mechanisms during an ESD event is
Autor:
Mohyuddin Mirza, Jaime Calderon, Forrest Patrick Scharf, Nick Savidov, Manjula Sarath Bandara
Publikováno v:
Acta Horticulturae. :225-234