Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Patrick Lambelet"'
Autor:
Dieter W. Pohl, Bettina Nechay, Lukas Novotny, Michael Pfeiffer, Claude Philipona, Taras Plakhotnik, Alois Renn, Abdeljalil Sayah, Joao-Manuel Segura, Beate Sick, Uwe Siegner, Guido Tarrach, Rüdiger Vahldieck, Urs P. Wild, Dieter Zeisel, Alfred J. Meixner, Olivier J.F. Martin, Fabienne Marquis-Weible, Hermann Bach, Martin A. Bopp, Volker Deckert, Pierre Descouts, Rolf Eckert, Hans-Joachim Güntherodt, Christian Hafner, Bert Hecht, Harry Heinzelmann, Thomas Huser, Mark Jobin, Ursula Keller, Thilo Lacoste, Patrick Lambelet, Renato Zenobi
Publikováno v:
CHIMIA, Vol 51, Iss 10 (1997)
Scanning near-field optical microscopy (SNOM) is an optical microscopy whose resolution is not bound to the diffraction limit. It provides chemical information based upon spectral, polarization and/or fluorescence contrast images. Details as small as
Externí odkaz:
https://doaj.org/article/aeecef7311c944e2a3063a8f07254b5f
Autor:
Patrick Lambelet
Publikováno v:
Religious Studies Review. 43:201-201
Publikováno v:
Ultramicroscopy. 71:117-121
Tip-to-sample shear force distance control of a scanning near-field optical microscope (SNOM) is more critical to implement in a liquid environment than in air. The higher viscosity of the medium increases the interaction forces between the tip and t
Autor:
Rudolf Moosburger, Patrick Lambelet
Publikováno v:
SPIE Proceedings.
White-light interferometry is a highly accurate technology for 3D measurements. The principle is widely utilized in surface metrology instruments but rarely adopted for in-line inspection systems. The main challenges for rolling out inspection system
Autor:
Michael Kahl, Marc Honegger, Andreas Ettemeyer, Patrick Lambelet, Stefan Rinner, Sandra Trunz
Publikováno v:
SPIE Proceedings.
In an earlier paper we have described a concept for high speed 3D inspection using fringe projection techniques. We use a special CMOS camera with 300 x 300 px which can calculate the phase on board. The focus of the first step of development had bee
Publikováno v:
AIP Conference Proceedings.
The paper presents novel interferometric measurement technique applied for MEMS dynamic properties measurements. The method was developed especially for multi-channel interferometer developed under SMARTIEHS EU project. The method employs sinusoidal
Autor:
Christophe Gorecki, Malgorzata Kujawinska, K. Gastinger, Adam Styk, S. Beer, Karl Henrik Haugholt, U. D. Zeitner, Michal Jozwik, Patrick Lambelet, Roman Paris
Publikováno v:
SPIE Proceedings.
The paper presents the novel approach to an interferometric, quantitative, massive parallel inspection of MicroElectroMechanicalSystems (MEMS), MicroOptoElectroMechanical Systems (MOEMS) and microoptics arrays. The basic idea is to adapt a micro-opti
Publikováno v:
SPIE Proceedings.
Fringe projection techniques have been widely used for inspection of free form surfaces for quality inspection or reverse engineering purposes. For inline 3D-inspection systems maximum measuring speed is of vital interest. Typically, image acquisitio
Autor:
Patrick Lambelet
Publikováno v:
SPIE Proceedings.
Industry rely a lot on vision for in line or off line quality inspection. Whereas most of these applications use 2D vision, the need for 3D vision is increasing. Optical Coherence Tomography (OCT) is widely used in medical application to obtain 3D im
Autor:
Sylwester Bargiel, Christoph Schaeffel, Jorge Albero, Malgorzata Kujawinska, Uwe D. Zeitner, Rudolf Moosburger, Michal Jozwik, Patrick Lambelet, Peter Dannberg, Lars Johnsen, S. Beer, Kay Gastinger, Marco Pizzi
The paper introduces different approaches to overcome the large ratio between wafer size and feature size in the testing step of micro production. For the inspection of Micro(Opto)ElectroMechanicalSystems (M(O)EMS) a priori information are available
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ccb20223236546b142375fdc616defa8