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of 6
pro vyhledávání: '"Patrick L. Cole"'
Implications of the Logical Decode on the Radiation Response of a Multi-Level Cell NAND Flash Memory
Autor:
Ken Hunt, J. David Ingalls, Adam R. Duncan, Matthew J. Kay, Patrick L. Cole, Matthew J. Gadlage
Publikováno v:
IEEE Transactions on Nuclear Science. 60:4451-4456
The radiation response of a multi-level cell (MLC) NAND flash is used to determine the organization of logical states as they correspond to floating gate charge levels of constituent bit cell transistors. This “logical decode” is then used to dem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9e9bfafdf803ced0775a9c524b721bc8
https://doi.org/10.1109/tns.2013.2282699
https://doi.org/10.1109/tns.2013.2282699
Autor:
Casey H. Rice, J. David Ingalls, Casey C. Hedge, Ken Bole, Holly Bradley, Ethan Johnson, Brian D. Olson, James Staggs, Patrick L. Cole, Adam R. Duncan, Sarah E. Armstrong, W.M. Shedd
Publikováno v:
2015 IEEE Radiation Effects Data Workshop (REDW).
Commercial gallium nitride (GaN) high-electron mobility transistors (HEMTs) are tested in the radio frequency (RF) spectrum at heavy ion facilities to explore space environment stresses on these emerging technologies. Findings indicate that gate leak
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b4b39376d08a21b5b2ae4c2d2d37707e
https://doi.org/10.1109/redw.2015.7336715
https://doi.org/10.1109/redw.2015.7336715
Autor:
Casey H. Rice, Brian D. Olson, Casey C. Hedge, J. David Ingalls, Adam R. Duncan, Patrick L. Cole, Sarah E. Armstrong
Publikováno v:
2015 IEEE Radiation Effects Data Workshop (REDW).
Commercial gallium nitride high-electron mobility transistors are tested at Texas A&M University cyclotron. Degradation of gate and drain currents is characterized.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::181a52f90e8715d348cde667f74d482f
https://doi.org/10.1109/redw.2015.7336720
https://doi.org/10.1109/redw.2015.7336720
Publikováno v:
Workshop Record. 1994 IEEE Radiation Effects Data Workshop.
Transistors and commercial operational amplifiers from the AT&T CBIC-R, CBIC-U2 and CBIC-V2 bipolar processes were tested to Co60 ionizing radiation. High and low rate Co60 dose rates were used along with various bias conditions. The data shows the C
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4601da3d65054234af713eb17e9c5b16
https://doi.org/10.1109/redw.1994.633043
https://doi.org/10.1109/redw.1994.633043
Conference
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Akademický článek
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