Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Patrick Cao Li"'
Publikováno v:
2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD).
The critical building blocks that have enabled high-performance and high-reliability BCD technologies optimized for power management applications over the past 30 years are identified. These building blocks, which include process modules, equipment,
Autor:
Manjunatha Prabhu, Tsung-Che Tsai, Natarajan Mahadeva Iyer, Guowei Zhang, Haojun Zhang, Patrick Cao Li, Jian-Hsing Lee
Publikováno v:
2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
The fundamental physical mechanism decreasing transistor SOA boundary and ID with the increasing transistor total width is identified and reported for the first time. The skin effect, proximity and Hall-effect arising from the large varying-current a
Autor:
Marku, Algerta1 (AUTHOR), Carrion, Maria Dolores Perez2,3 (AUTHOR), Pischedda, Francesca2 (AUTHOR), Marte, Antonella4,5 (AUTHOR), Casiraghi, Zeila1 (AUTHOR), Marciani, Paola1 (AUTHOR), von Zweydorf, Felix6 (AUTHOR), Gloeckner, Christian Johannes6,7 (AUTHOR), Onofri, Franco4,5 (AUTHOR), Perego, Carla1 (AUTHOR) carla.perego@unimi.it, Piccoli, Giovanni2 (AUTHOR) giovanni.piccoli@unitn.it
Publikováno v:
Scientific Reports. 3/2/2020, Vol. 10 Issue 1, p1-10. 10p.