Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Patrick B. Dunbeck"'
Publikováno v:
2014 IEEE AUTOTEST.
As strategic-grade instrumentation becomes increasingly more complex and accurate, developing robust, flexible, and cost-effective test platforms is paramount. Custom Automated Test Equipment (ATE) solutions designed to detect assembly defects and ve
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::98bef5a68dd83fdce6461903ff41f819
https://doi.org/10.1109/autest.2014.6935116
https://doi.org/10.1109/autest.2014.6935116
Autor:
Rolf D. Reitz, Patrick B. Dunbeck
Publikováno v:
SAE Technical Paper Series.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eec73c752700a4331fea0e5511181290
https://doi.org/10.4271/2010-01-0869
https://doi.org/10.4271/2010-01-0869