Niobium Contamination in Silicon

Autor: Polignano ML, Codegoni D, Borionetti G, Bonoli F, Brivio J, Greco S, Marino A, Monge P, Patoprsta I, Privitera V, Riva C

Publikováno v: 218th ECS Meeting: E6-High Purity Silicon 11, Las Vegas, USA, 2010
info:cnr-pdr/source/autori:Polignano ML, Codegoni D, Borionetti G, Bonoli F, Brivio J, Greco S, Marino A, Monge P, Patoprsta I, Privitera V, Riva C/congresso_nome:218th ECS Meeting: E6-High Purity Silicon 11/congresso_luogo:Las Vegas, USA/congresso_data:2010/anno:2010/pagina_da:/pagina_a:/intervallo_pagine

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=cnr_________::7c94242250b8a41e9b0f5b6c3e61caa7
https://publications.cnr.it/doc/87004