Scanning Probe Microscopy Markup Language

Autor: Bolhuis, T., Pasop, J., Abelmann, L., Lodder, J.C., Koenraad, Paul M., Kemerink, Martijn

Publikováno v: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques: 12th International Conference STM'03, 271-279
STARTPAGE=271;ENDPAGE=279;TITLE=Scanning Tunneling Microscopy/Spectroscopy and Related Techniques

The numerous, proprietary file formats for Scanning Probe Microscopy (SPM) have caused problems in the field of both off‐line quantitative, data analysis and comparison, as well as long‐term archiving of measurement results. Because of the eminen

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e708b5c1a81ac29e3cb51117254f353b
https://research.utwente.nl/en/publications/scanning-probe-microscopy-markup-language(7d9f48f2-21ed-4451-b882-4a305ee8bcdb).html

Micro Scanning Probe Array Memory (micro-SPAM)

Autor: Leon Abelmann, Phillips, G. N., Den Bos, A. G., Pasop, J., Martin Herman Siekman, Thijs Bolhuis, Heskamp, I. R., Lodder, J. C., Gijs J.M. Krijnen, Amerongen, J.

Publikováno v: MESA+ Day 2000
University of Twente Research Information (Pure Portal)

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::87a4c40084484a692baf34a263b55d42
https://research.utwente.nl/en/publications/micro-scanning-probe-array-memory-microspam(2a1dafde-9675-433d-adb0-15e20706c757).html