Zobrazeno 1 - 10
of 57
pro vyhledávání: '"Pasi Tamminen"'
Autor:
Toni Viheriakoski, Pasi Tamminen
Publikováno v:
2022 44th Annual EOS/ESD Symposium (EOS/ESD).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9dfcb6dc068adbb29fff3b73ae8ef547
https://doi.org/10.23919/eos/esd54763.2022.9928515
https://doi.org/10.23919/eos/esd54763.2022.9928515
Publikováno v:
2019 41st Annual EOS/ESD Symposium (EOS/ESD).
Electrical connectors can get static charges during handling and discharge on a printed circuit board when assembled. The rise time and shape of the discharge current waveform is studied with simulation and measurement methods. Results predicts that
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bbe7c9f736ea0d789ae20d54a83d3bc4
https://doi.org/10.23919/eos/esd.2019.8869966
https://doi.org/10.23919/eos/esd.2019.8869966
Autor:
Richard Wong, Friedrich zur Nieden, Reinhold Gartner, Pasi Tamminen, Rita Fung, Toni Viheriakoski
Publikováno v:
2019 41st Annual EOS/ESD Symposium (EOS/ESD).
ESD sensitive devices inside protective packaging may be exposed to high stress levels outside ESD protected area. ESD shielding bags are therefore tested with realistic stress levels by a system level ESD generator. The aim of this study is to estim
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92db62b6bf018a64609afa78bb6b77b4
https://doi.org/10.23919/eos/esd.2019.8869964
https://doi.org/10.23919/eos/esd.2019.8869964
Publikováno v:
Journal of Electrostatics. 79:38-44
Electrostatic discharge sensitivity of integrated circuits is compared with electrical failure levels in electronics assembly. Electrical components with a low electrostatic discharge withstand voltage would be expected to have more electrical failur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16b2f82c15a8b8fc9d94ff6578d3eb14
https://doi.org/10.1016/j.elstat.2015.12.002
https://doi.org/10.1016/j.elstat.2015.12.002
Publikováno v:
Microelectronics Reliability. 115:113977
Electrical connectors can get static charges during handling and discharge on a printed circuit board when assembled. The rise time and shape of the discharge current waveform is studied with simulation and measurement methods. Results show that the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dc551d060408eda203c457d15a1bc6a8
https://doi.org/10.1016/j.microrel.2020.113977
https://doi.org/10.1016/j.microrel.2020.113977
Autor:
Richard Wong, Reinhold Gartner, Jeremy Smallwood, Rita Fung, Toni Viheriakoski, Pasi Tamminen
Publikováno v:
2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Clam shells can provide better ESD protection than shielding bags. Energy coupling in a near field is generally reduced by preventing a direct connection, decreasing capacitive coupling, and increasing breakdown field strength. A properly qualified s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::444e29146dd9c518c7a654b5d5fc859f
https://doi.org/10.23919/eos/esd.2018.8509697
https://doi.org/10.23919/eos/esd.2018.8509697
Publikováno v:
Journal of Electrostatics. 77:174-181
ESD control programs that are based on the standards IEC61340-5-1 and ANSI/ESD S20.20 are targeted to provide safer handling of electronic parts now susceptible to damage by electrostatic discharge. However, ESD failures have occurred in EPA even whe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2054072544d7db60e1980ac89629c38e
https://doi.org/10.1016/j.elstat.2015.08.009
https://doi.org/10.1016/j.elstat.2015.08.009
Publikováno v:
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Measurement of body voltage alone can result in erroneous conclusions in qualification of footwear and flooring systems in combination with a person. Measurement uncertainties should be taken into account. We have studied the time dependency and char
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b67b5b9750441397cfb57dee801e0be2
https://doi.org/10.23919/eosesd.2017.8073440
https://doi.org/10.23919/eosesd.2017.8073440
Publikováno v:
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
ESD control items are generally characterized by direct current measurements at certain voltage levels. Discharge resistance may, however, have a remarkable voltage and frequency dependency. We have assessed conductive polymers by comparing the resis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::795106ded0956d5d96b59634bf5a480c
https://doi.org/10.23919/eosesd.2017.8073442
https://doi.org/10.23919/eosesd.2017.8073442
Publikováno v:
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Electrical components with a lower CDM ESD immunity can require additional protection methods in manufacturing. Discharge current measurements and electromagnetic pulse detection gives valuable data for more detailed ESD risk assessments. However, bo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::276c45802e065af91a214762fafa28a6
https://doi.org/10.23919/eosesd.2017.8073421
https://doi.org/10.23919/eosesd.2017.8073421