Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Pascal Oser"'
Publikováno v:
Sensors, Vol 19, Iss 19, p 4107 (2019)
The introduction of the Internet of Things (IoT), i.e., the interconnection of embedded devices over the Internet, has changed the world we live in from the way we measure, make calls, print information and even the way we get energy in our offices o
Externí odkaz:
https://doaj.org/article/2b03dd7daf1348deaf588d3e29e3f709
Publikováno v:
Security and Trust Management ISBN: 9783031295034
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::895ad21b4d2c32eccdf545d0e975cb55
https://doi.org/10.1007/978-3-031-29504-1_3
https://doi.org/10.1007/978-3-031-29504-1_3
Internet of Things (IoT) devices are becoming more widespread not only in areas such as smart homes and smart cities but also in research and office environments. The sheer number, heterogeneity, and limited patch availability provide significant cha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b75aabf526d141420900a887e6d80891
http://cds.cern.ch/record/2852714
http://cds.cern.ch/record/2852714
Autor:
Jakob Karolus, Pascal Oser, Frank Kargl, Akash Gupta, Paweł W. Woźniak, Sebastian S. Feger, Stefan Lüders, Dayana Spagnuelo, Albrecht Schmidt
Publikováno v:
Oser, P, Feger, S, Woźniak, P, Karolus, J, Spagnuelo, D, Gupta, A, Lüders, S, Schmidt, A & Kargl, F 2020, ' SAFER: Development and Evaluation of an IoT Device Risk Assessment Framework in a Multinational Organization ', Proceedings of the ACM on Interactive, Mobile, Wearable and Ubiquitous Technologies, vol. 4, no. 3, 114, pp. 1-22 . https://doi.org/10.1145/3414173
Proceedings of the ACM on Interactive, Mobile, Wearable and Ubiquitous Technologies, 4(3):114, 1-22. ACM
Proceedings of the ACM on Interactive, Mobile, Wearable and Ubiquitous Technologies, 4(3):114, 1-22. ACM
Users of Internet of Things (IoT) devices are often unaware of their security risks and cannot sufficiently factor security considerations into their device selection. This puts networks, infrastructure and users at risk. We developed and evaluated S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7d553f75c49d8cc3404a0dede78af04f
http://arxiv.org/abs/2007.14724
http://arxiv.org/abs/2007.14724
Publikováno v:
Security, Privacy, and Anonymity in Computation, Communication, and Storage ISBN: 9783030053444
SpaCCS
SpaCCS
The number of devices of the so-called Internet of Things (IoT) is heavily increasing. One of the main challenges for operators of large networks is to autonomously and automatically identify any IoT device within the network for the sake of computer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c3368ea103369099c9b10fe31382ddb1
http://cds.cern.ch/record/2653655
http://cds.cern.ch/record/2653655
Publikováno v:
IEEE Transactions on Nuclear Science. 62:2635-2642
This paper presents a single event burnout (SEB) sensitivity characterization for power MOSFETs, independent from tests, through a prediction model issued from TCAD analysis and the knowledge of device topology. The methodology is applied to a STRIPF
Autor:
R. Garcia Alia, Roberto Losito, Laurent Dusseau, Markus Brugger, P. Peronnard, Julien Mekki, R. Gaillard, Salvatore Danzeca, Pascal Oser, Giovanni Spiezia, A. Masi, M. Brucoli
Publikováno v:
IEEE Transactions on Nuclear Science. 61:3424-3431
A system to monitor the radiation levels is required in the Large Hadron Collider (LHC) and its injection lines in order to quantify the radiation effects on electronics. Thus, the RadMons were installed in critical areas where equipment is or will b
Autor:
G. Ruggiero, G. Foucard, R. Gaillard, Julien Mekki, K. Stachyra, A. Masi, Pascal Oser, Salvatore Danzeca, E. Fadakis, Paul Peronnard, Markus Brugger, R. Garcia Alia, Roberto Losito, Giovanni Spiezia, R. Secondo
Publikováno v:
2017 IEEE Radiation Effects Data Workshop
2017 IEEE Radiation Effects Data Workshop, Jul 2017, New Orleans, United States. pp.1-6, ⟨10.1109/NSREC.2017.8115434⟩
2017 IEEE Radiation Effects Data Workshop, Jul 2017, New Orleans, United States. pp.1-6, ⟨10.1109/NSREC.2017.8115434⟩
In the context of the CERN 'Radiation To Electronics (R2E)' project, the vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analysed. The tested
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4482a34fecd876dde6e036a5ab407ffc
https://hal.archives-ouvertes.fr/hal-01768145
https://hal.archives-ouvertes.fr/hal-01768145
Autor:
R. Gaillard, Pascal Oser, Julien Mekki, G. Foucard, A. Masi, Giovanni Spiezia, E. Fadakis, P. Peronnard
Publikováno v:
IEEE Transactions on Nuclear Science. 61:1865-1873
It is essential to characterize power MosFETs regarding their tolerance to destructive Single Event Burnouts (SEB). Therefore, several non-destructive test methods have been developed to evaluate the SEB cross-section of power devices. Power MosFETs
Publikováno v:
Sensors (Basel, Switzerland)
Sensors, Vol 19, Iss 19, p 4107 (2019)
Sensors, Vol 19, Iss 19, p 4107 (2019)
The introduction of the Internet of Things (IoT), i.e., the interconnection of embedded devices over the Internet, has changed the world we live in from the way we measure, make calls, print information and even the way we get energy in our offices o