Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Pascal Meisse"'
Publikováno v:
2017 11th European Conference on Antennas and Propagation (EUCAP)
2017 11th European Conference on Antennas and Propagation (EUCAP), Mar 2017, Paris, France. pp.3788-3791, ⟨10.23919/EuCAP.2017.7928749⟩
2017 11th European Conference on Antennas and Propagation (EUCAP), Mar 2017, Paris, France. pp.3788-3791, ⟨10.23919/EuCAP.2017.7928749⟩
This paper presents measurement technique for antenna pattern including gain on planar near field ranges. Although rigorous formalism exists, this formalism is not commonly used due to its complexity. Simplified equations are derived in particular an
Publikováno v:
AMTA 2016
AMTA 2016, Oct 2016, Austin, United States. ⟨10.1109/amtap.2016.7806277⟩
AMTA 2016, Oct 2016, Austin, United States. ⟨10.1109/amtap.2016.7806277⟩
The uncertainty on the far field, obtained from antenna planar near field measurements, due to the limitation of the dynamic range is investigated by means of numerical analysis. The dynamic range is usually limited by the noise and the receiver nonl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::00836ee363e1769159ea1027094b5a3e
https://hal-centralesupelec.archives-ouvertes.fr/hal-01448314
https://hal-centralesupelec.archives-ouvertes.fr/hal-01448314
Publikováno v:
2016 IEEE Conference on Antenna Measurements & Applications (CAMA)
2016 IEEE Conference on Antenna Measurements & Applications (CAMA), Oct 2016, Syracuse, United States. ⟨10.1109/CAMA.2016.7815766⟩
2016 IEEE Conference on Antenna Measurements & Applications (CAMA), Oct 2016, Syracuse, United States. ⟨10.1109/CAMA.2016.7815766⟩
The uncertainty on the far field, obtained from antenna planar near field measurements, due to position errors is investigated by means of numerical analysis. These errors include periodic and random errors in both transverse and longitudinal directi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::29156d25bfed1598fc9e2e268a143cc0
https://hal-centralesupelec.archives-ouvertes.fr/hal-01448310
https://hal-centralesupelec.archives-ouvertes.fr/hal-01448310
Publikováno v:
SPIE Proceedings.
The realization of an experimental setup for the characterization of a high critical temperature superconductor (HTCS) thin film by a microwave measurement is described. This approach allows HTCS parameters, like surface resistance in microwaves, to
Conference
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