Zobrazeno 1 - 10
of 84
pro vyhledávání: '"Pascal Ancey"'
Autor:
Nathalie Rolland, C. Kinkelin, Malek Zegaoui, Sandrine Lhostis, Frédéric Lefèvre, Y. Kaplan, Emmanuel Ollier, B. Descouts, H. Le Poche, Stéphane Lips, Pascal Ancey, V. Remondière, A.L. Seiler, Paul-Alain Rolland, U. Soupremanien, Jean Dijon
Publikováno v:
Microelectronic Engineering
Microelectronic Engineering, Elsevier, 2014, 127, pp.28-33. ⟨10.1016/j.mee.2014.03.016⟩
Microelectronic Engineering, 2014, 127, pp.28-33. ⟨10.1016/j.mee.2014.03.016⟩
Microelectronic Engineering, Elsevier, 2014, 127, pp.28-33. ⟨10.1016/j.mee.2014.03.016⟩
Microelectronic Engineering, 2014, 127, pp.28-33. ⟨10.1016/j.mee.2014.03.016⟩
As the power of electronic systems is increasing, thermal fluxes are getting higher, up to more than 100 W/cm 2 in the more critical cases. They result in hot spots with various consequences, especially performance reduction and reliability issues. M
Autor:
P. Renaux, Laurent Duraffourg, D. Renaud, Julien Arcamone, Eric Colinet, Eric Ollier, A. Berthelot, F. Casset, Pascal Ancey, P. Robert
Publikováno v:
Microelectronic Engineering. 88:2364-2367
The paper reports on an integrated device combining a single-crystal silicon NEMS with an embedded MOS transistor in transconductance configuration fabricated with a simple and low cost technology based on localized Silicon on Nothing technology. Tha
Autor:
Bernard Flechet, E. Eid, J. Roullard, L. Cadix, P. Leduc, S. Capraro, Francis Calmon, Pascal Ancey, O. Valorge, Alexis Farcy, Cedric Bermond, Thierry Lacrevaz
Publikováno v:
Microelectronic Engineering. 88:729-733
This work addresses parasitic substrate coupling effects in 3D integrated circuits due to Through Silicon Vias (TSV). Electrical characterizations have been performed on dedicated test structures in order to extract electrical models of substrate cou
Autor:
B. Giffard, P. Coudrain, C. Lagahe-Blanchard, X. Gagnard, Perrine Batude, P. Magnan, Pascal Ancey, M. Vinet, Yvon Cazaux, A. Pouydebasque, C. Leyris, A. Castex
Publikováno v:
IEEE Transactions on Electron Devices. 56:2403-2413
A new 3-D CMOS image sensor architecture is presented as a potential candidate for submicrometer pixels. To overcome the scaling challenge related to miniaturized pixel design rules, far beyond traditional 3-D stacking alignment capabilities, a seque
Publikováno v:
Microelectronic Engineering. 85:1940-1946
Passive components are key elements for the integration of system-on-chips, fixing circuit performance and down-scaling capability. The integration of MIM capacitors and inductors among Cu BEOL of CMOS technologies faces many challenges and requires
Publikováno v:
IEEE Microwave Magazine. 9:104-116
This article presented the design of two band reject filters in the BAW technology. The two designs show different benefits. The ladder T topology has a better rejection bandwidth than the ladder topology because the bandwidth is controlled by resona
Autor:
Laurent Ulmer, Jean-Pierre Blanc, Emmanuel Defay, Bernard Andre, Emmanuelle Serret, Sophie Verrun, Philippe Delpech, Marc Aid, Pierre Garrec, Julie Guillan, Denis Pellissier, Pascal Ancey, David Wolozan
Publikováno v:
Solid-State Electronics. 51:1624-1628
This paper describes realization and characterization of SrTiO 3 (STO) high K MIM capacitors above BiCMOS integrated circuit (IC). These capacitances are connected to IC and are used as coupling capacitors in order to realize a high pass filter. Surf
Publikováno v:
Microelectronic Engineering. 84:1369-1373
This paper describes a new process for the vertical co-integration of AlSi MEMS tunable capacitors and thick-Cu high-Q inductors. Tunable area MEMS capacitors with fragmented electrodes and with both thermal and electrostatic actuators are designed a
Publikováno v:
IEEE Transactions on Magnetics. 41:3544-3549
Size reduction for spiral inductors is investigated. We reveal bidirectional ferromagnetic inductors with an /spl sim/30% to 135% increase in L over the air-core value. This is advantageously realized by using single deposition. The realization uses
Publikováno v:
IEEE Journal of Solid-State Circuits. 38:2318-2324
Addressing reconfiguration of radio frequency (RF) systems might require high performance integrated RF switching capabilities. In this regard, a particular design experience of an integrated circuit (IC) monolithically integrated microelectromechani