Zobrazeno 1 - 1
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pro vyhledávání: '"Panjwani SA"'
Autor:
Xu Z; Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA 37235., Panjwani SA; Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA 37235., Lee CP; Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA 37235., Burke RP; Biomedical Engineering, Vanderbilt University, Nashville, TN, USA 37235., Baucom RB; General Surgery, Vanderbilt University, Nashville, TN 37235., Poulose BK; General Surgery, Vanderbilt University, Nashville, TN 37235., Abramson RG; Radiology and Radiological Science, Vanderbilt University, Nashville, TN 37235., Landman BA; Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA 37235; Biomedical Engineering, Vanderbilt University, Nashville, TN, USA 37235; Radiology and Radiological Science, Vanderbilt University, Nashville, TN 37235.
Publikováno v:
Proceedings of SPIE--the International Society for Optical Engineering [Proc SPIE Int Soc Opt Eng] 2016 Feb 27; Vol. 9784. Date of Electronic Publication: 2016 Mar 21.