Zobrazeno 1 - 10
of 43
pro vyhledávání: '"Pandini, Davide"'
Autor:
Forzan, Cristiano, Pandini, Davide
Publikováno v:
Dans Design, Automation and Test in Europe - DATE'05, Munich : Allemagne (2005)
In signal integrity analysis, the joint effect of propagated noise through library cells, and of the noise injected on a quiet net by neighboring switching nets through coupling capacitances, must be considered in order to accurately estimate the ove
Externí odkaz:
http://arxiv.org/abs/0710.4639
Autor:
Pandini, Davide1,2,3,4
Publikováno v:
Journal of Technical Analysis. Spring2022, Issue 72, p49-103. 55p.
Autor:
Forzan, Cristiano, Pandini, Davide
Publikováno v:
In Integration, the VLSI Journal 2009 42(3):409-435
Autor:
Malcovati, Piero, Pandini, Davide, Puglisi, Francesco Maria, Giacomini, Davide, Baschirotto, Andrea
Publikováno v:
Solid-State Circuits Magazine, IEEE; 2023, Vol. 15 Issue: 2 p167-170, 4p
Autor:
PANDINI, DAVIDE
Nowadays a lot of physical techniques are available in order to have information about an historical painting. They are able to know which chemical elements are present in the paint layer, or they are also able to show the pattern under the colored l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7339194f43a8e47cf18df63acf0eb7ba
Publikováno v:
2013 23rd International Workshop on Power & Timing Modeling, Optimization & Simulation (PATMOS); 2013, p259-264, 6p
Autor:
Cazzaniga, Marco, Doriol, Patrice Joubert, Blanc, Emmanuel, Liberali, Valentino, Pandini, Davide
Publikováno v:
2013 23rd International Workshop on Power & Timing Modeling, Optimization & Simulation (PATMOS); 2013, p107-111, 5p
Publikováno v:
2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI); 2013, p133-138, 6p
Autor:
Cazzaniga, Marco, Joubert Doriol, Patrice, Sanna, Aurora, Blanc, Emmanuel, Liberali, Valentino, Pandini, Davide
Publikováno v:
2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo); 2013, p129-133, 5p
Autor:
Doriol, Patrice Joubert, Sanna, Aurora, Chandra, Akhilesh, Forzan, Cristiano, Pandini, Davide
Publikováno v:
2012 IEEE 16th Workshop on Signal & Power Integrity (SPI); 1/ 1/2012, p107-110, 4p